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Used 3070/i3070 In-Circuit Test Systems

Looking at alternative Keysight in-circuit test options such as used and pre-owned HP 3070 or Keysight 3070/i3070 ICT systems?

Keysight offers you the reliability of ISO audited remanufacturing and calibration processes to ensure your used ICT system will run as good as new when you choose to buy from us. You can also have peace of mind that your systems will come with the latest software revisions with legitimate licensing.

Contact us today for a customized quote!

If you have a Keysight ICT system that is no longer in use, we are willing to buy it back from you. Contact us today!

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How to build a fixture for use with the Keysight Cover-Extend Technology
Cover-Extend Technology is Keysight’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

Application Note 2017-12-05

Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5
Keysight's Medalist i3070 Series 5 comes with a new Analog Stimulus Response Unit (ASRU N) Revision card along with software release 08.00p. The ASRU N card has enhanced ASRU speedup features to reduce unpowered analog test time.

Application Note 2017-12-02

Test Coverage Consultant - Data Sheet
The Keysight Test Coverage Consultant is a standalone application that can be installed on your Windows® PC to enable you to quickly generate test coverage reports for your products. Keysight Test Coverage Consultant Keysight Medalist i3070 Series 5

Data Sheet 2017-12-01

Vectorless Test EP (VTEP) Goes Head-to-Head with Keysight TestJet - Case Study
VTEP has proven its abilities to improve in-circuit test coverage by over 80 percent compared to the older TestJet technology, especially on boards with hard-to-test packages such as BGAs, micro-BGAs, and SMT edge connectors.

Case Study 2017-12-01

Test Coverage Consultant - Technical Overview
This quick guide is designed to help you to get the Keysight Test Coverage Consultant up and running on your PC quickly.

Technical Overview 2017-12-01

The Keysight Panel Test and Throughput Multiplier Advantage - Technical Overview
Many have tried to emulate the Keysight Panel Test and Throughput Multiplier capabilities, yet our advantage remains in providing matchless high throughput and low total cost of ownership.

Technical Overview 2017-07-13

i3070 Inline ICT Improves Functional Test Yield of SSDs - Case Study
Find out how one customer reported first pass yield results of more than 95% with less than 0.5% false failures, after installing the i3070 Series 5 Inline ICT systems.

Case Study 2017-07-10

Medalist i3070 Test Throughput Optimization - Application Note
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Application Note 2017-06-16

Intellectual property and copyright protection on Agilent ICT products
This letter advises areas of intellectual property and copyright protection to look out for when customers elect to purchase Agilent in-circuit test products from third party vendors.

Feature Story 2014-07-31

Power Supply Connections for Your CET Signal Conditioner Card Application Note
The Cover-Extend Technology signal conditioner card can be powered from various sources. The recommended sources are discussed in this application note.

Application Note 2014-02-25

Keysight Medalist i3070 08.40p Software Release
Keysight Medalist i3070 08.40p software can be installed on testheads and test development stations with Windows 7 (32- bit and 64- bit) and Windows XP operating systems.

Release Notes 2014-02-17

3070/i3070 DUT Power Supply Document Library
This document library contains the installation manual, programming guide and operating guide/manual of the various models of DUT power supply that are supported on the Keysight 3070/i3070 ICT systems.

User Manual 2012-01-25

TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2010-12-22

Throughput comparison for Medalist i3070 Series 5 and i3070 In-Circuit Test
The new Medalist i3070 Series 5 in-circuit tester has several new features which enable manufacturers to speed up their tests, when compared with using the older i3070 series.

Case Study 2010-08-11

Programming Micron P8P PCM Flash Using Serial Peripheral Interface (SPI)
The Micron P8P phase change memory has a new serial peripheral interface to enable low cost, low pin count on-board programming using the Keysight Medalist i3070 in-circuit test solution.

Application Note 2010-04-01

Vectorless Test Solutions --An analysis of performance differences between VTEP
This white paper provides an analysis of performance differences between Keysight VTEP, FrameScan FX and TestJet Enhanced technologies.

Application Note 2009-11-03

In-Circuit Test Press Releases

Press Materials 2009-08-07

Overcoming Limited Access with Cover-Extend Technology at In-Circuit Test
This case study illustrates how Keysight's Cover-Extend Technology can help to enable test access for situations where test access becomes increasingly limited with usage of high complexity components on computer motherboards.

Case Study 2009-07-22

VTEP v2.0 Powered, with Cover-Extend Technology

Technical Overview 2009-06-26

Introduction to i3070
See the exciting features available on the Keysight Medalist i3070 07.00p. Click the link above to view a Flash Presentation on the i3070 In-Circuit Tester.

Demo 2009-06-25

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Network Parameter Measurement: Best Practices using the Keysight Medalist i3070
This paper describes how to maximize benefits from the Network Parameter Measurement capability on the Keysight Medalist i3070 in-circuit test system using enhancements in software version 7.20p.

Application Note 2009-04-02

In-Circuit Test Channel Partner Interview Series: Everett Charles Technology
The channel partners series began with an exploration of programming houses. It is not that we venture into the Fixture house side of the business. Please enjoy this extension of the article series.

Feature Story 2009-03-10

Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access
This article introduces the seven most prominent and effective limited access tools on the Keysight Medalist i3070 ICT, collectively known Super 7 suite.

Application Note 2009-03-06

In-Circuit Test Channel Partner Interview Series: QXQ, Inc.
This article is continues to educate on fixture houses in relation to in-circuit test as the article series explores fixturing houses that Agilent works regularly with. This article features QXQ, Inc.

Feature Story 2009-03-04

Enhanced Log Records for the Keysight Medalist In-Circuit Test System
Track changes made to your i3070 test programs to improve success.

Application Note 2009-03-04


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