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Reference Solution

Creating the solution you need

As you seek solutions to evolving test challenges, Keysight Reference Solutions provide the right combination of hardware, software, and measurement expertise through programming examples – highly optimized for specific applications. Reference Solutions show you how to get the most out of your test equipment, helping you achieve half the time to insight.

Keysight Reference Solutions:

  • Increase confidence in solving your test challenges
  • Enable quick evaluation of the test solution’s performance & capability for a specific application
  • Dramatically reduce the time it takes to integrate a new test system into a test environment
  • Leverage Keysight’s measurement expertise and software for specific application requirements

In specialized applications, Keysight and our Solutions Partners are ready to work with you to define and integrate your next-generation test solution.

The PXI and AXIe solutions described below have been designed to fit with specific applications, and leverage modular scalability, footprint and performance. Each Reference Solution can easily be customized to meet your own test needs.

Look to Keysight in modular—and achieve half the time to insight with Keysight Reference Solutions.
 

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TS-8989 System Block Diagram
TS-8989 System Block Diagram

Operation Manual 2014-03-14

PDF PDF 2.34 MB
Designing Scalable 10G Backplane Interconnect Systems
This Paper presents techniques for design which significantly reduce modeling requirements for the design of high-speed backplanes in conjunction with advanced testing techniques which provide maximum channel characterization with the minimum amount of time.

Technical Overview 2012-05-05

PDF PDF 1.46 MB
N1930B Physical Layer Test System Videos
This video will show how to probe various passive interconnect features on a printed circuit board using the novel Automatic Fixture Removal (AFR) process.

Demo 2011-03-30

Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

PDF PDF 2.44 MB
Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

PDF PDF 2.75 MB
Network Analysis - Advanced Measurements and Modeling of Differential Devices

Application Note 2006-01-06

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