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Source Measure Unit

A Source/Measure Unit, or SMU, is a source and measurement resource for test applications requiring high accuracy, high resolution and measurement flexibility. SMUs are sometimes also referred to as source monitor units. An SMU can precisely force voltage or current and simultaneously measure voltage and/or current.

Keysight Technologies is the leader in the Source/Measure and Source/Monitor Unit (SMU) market. Keysight provides a wide range of SMU products, which are categorized into four areas: Precision, Application Specific, General-Purpose, and Basic.

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Basic Instruments Flyer: May - July 2019
This Basic Instruments flyer includes a promotion for a free scope probe.

Brochure 2019-04-17

PDF PDF 7.74 MB
Renew Your B1500A Series Mainframe for the latest windows and PC
This Technical Overview introduces the upgrade from Windows XP to Windows 7 for B1500A and B1505A.

Technical Overview 2019-04-01

B2900A Precision Source/Measure Unit User’s Guide
Describes the front panel operation, installation, and functions of Keysight B2900.

User Manual 2019-03-31

B2900A Precision Source/Measure Unit SCPI Command Reference
Contains reference information to help you program Keysight B2900 over the remote interface using the SCPI programming language.

Programming and Syntax Guide 2019-03-31

PDF PDF 3.58 MB
B2900A Series Precision Source/Measure Unit - Data Sheet
Keysight B2900A Series Precision Source / Measure Units are cost-effective source/measurement solutions offering superior performance and a best-in-class graphical user interface.

Data Sheet 2019-03-29

Bipolar Transistor Characterization Using the B2900A Series of SMUs - Application Note
This application note describes the characterization of Bipolar transistors using the B2900a precision source/measure units.

Application Note 2019-03-26

B2900A Series Precision Source/Measure Unit - Configuration Guide
This configuration guide has step-by-step instructions to help you configure an SMU and its related accessories to meet specific test requirements.

Configuration Guide 2019-03-25

Design and Test Solutions for Electro Mobility (E-Mobility) Applications - Solution Brief
This guide explores the electro mobility landscape, and the new design and test challenges and solutions to help bring disruptive technologies for e-mobility to reality faster.

Solution Brief 2019-03-11

Random Telegraph Noise (RTN) Measurement of Advanced MOSFET using B1500A WGFMU Module - Application
This application note describes random telegraph noise (RTN) measurement in advanced MOSFETs using the B1500A’s WGFMU module and shows actual measurement examples.

Application Note 2019-02-26

N6700 Modular Power System Family - Data Sheet
The N6705 DC Power Analyzer represents an entirely new instrument category for R&D engineers. It provides unrivaled productivity gains when sourcing and measuring DC voltage and current into a DUT.

Data Sheet 2019-02-14

N6705C DC Power Analyzer – User Manual
This manual discusses user information about the N6705 DC Power Analyzer. It does not include programming or service information.

User Manual 2019-02-03

N6700 Series Low-Profile Modular Power System - User Manual
This manual discusses user information about the N6700C Series Low-Profile Modular Power System. It does not include programming or service information.

User Manual 2019-02-02

How to Optimize Power Supply Testing Using the Keysight N6790 Series - Application Note
The Keysight N6790 Series electronic load modules give you unmatched performance and speed for power supply test. For bench or system applications in any testing environment, you can count on high quality and reliability with superior performance and features.

Application Note 2019-02-01

B1500A Semiconductor Device Analyzer - Data Sheet
The Keysight B1500A Semiconductor Device Analyzer is a modular instrument with a ten-slot configuration that supports both IV and CV measurements. Its familiar MS Windows user interface supports Keysight’s new EasyEXPERT software, which provides a new, more intuitive task-oriented approach to device characterization. Because of its extremely low-current, low-voltage, and integrated capacitance measurement capabilities, the Keysight B1500A can be used for a wide range of semiconductor device characterization needs.

Data Sheet 2018-12-14

Laser Diode Characterization and Its Challenges
This white paper discusses the laser diode characterization and the challenges the test engineer faces.

Application Note 2018-10-29

B1500A Semiconductor Device Analyzer - Technical Overview
This technical overview describes the complete device characterization solution covering measurement needs from basic IV and CV to ultra-fast pulsed and transient IV measurement using the B1500A semiconductor device analyzer.

Technical Overview 2018-09-28

Bench-Top Test and Debug of Power Transient Issues for Automotive and Aerospace/Defense Applications
Using the N6705A for bench-top test and debug of power transient issues for automotive and aerospace/defense

Application Note 2018-09-19

N6781A 3D Model, STEP Format
STEP format 3D Model of the N6781A module to be used with N6700 series mainframes. This model is mainly for reference purpose only.

Technical Overview 2018-08-16

ZIP ZIP 296.80 KB
N6786A 3D Model, STEP Format
STEP format 3D Model of the N6786A module to be used with N6700 series mainframes. This model is mainly for reference purpose only.

Technical Overview 2018-08-16

ZIP ZIP 275.41 KB
N6785A 3D Model, STEP Format
STEP format 3D Model of the N6785A module to be used with N6700 series mainframes. This model is mainly for reference purpose only.

Technical Overview 2018-08-16

ZIP ZIP 340.19 KB
N6782A, N6784A 3D Model, STEP Format
STEP format 3D Model of the N6782A and N6784A modules to be used with N6700 series mainframes. This model is mainly for reference purpose only.

Technical Overview 2018-08-16

ZIP ZIP 233.76 KB
N6705C, N6715C 3D Model, STEP Format
STEP format 3D Model of the N6705C and N6715C modular power analyzer.

Technical Overview 2018-07-27

ZIP ZIP 4.03 MB
LIV Test of VCSEL for 3D Sensing - Application Note
This application note explains what the challenges on an LIV characterization is, how the Keysight B2900A SMU can overcome them, and show examples to make LIV measurements using the B2900A Series.

Application Note 2018-07-02

Wide Range of Resistance Measurement Solutions from µΩ to PΩ - Application Note
This application note introduces keysight's resistance measurement solution, and discuss major error factors in resistance measurements and how to eliminate those error factors.

Application Note 2018-06-06

Design and Test Solutions for the Internet of Things - Solution Brochure
Develop mission-critical IoT devices to withstand the rigors of the real world—with flexible, high-performance design, test and security platforms.

Brochure 2018-05-16

AVI AVI 7.86 MB

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