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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

 

Accelerate Your Discovery with Comprehensive, Customizable Nanomeasurement Solutions from Keysight

Keysight Technologies, the winner of 2017 UNESCO Medal for Nanotechnologies Contributions, provides a wide range of high-performance nanoscale measurement instruments for research, industry and education. The applications cover most research fields including Chemistry, Materials Science, Chemical Engineering, Physics, Life Sciences, Semiconductors, Failure Analysis, etc.

Atomic Force Microscopy - Keysight offers a wide range of high-precision atomic force microscopes (AFM) to meet your unique research needs – no matter it is for high-resolution imaging, high-speed imaging or real-time, quantitative nanomechanical mapping capabilities. Our industry-leading environmental/temperature and fluid handling techniques enable superior control for electrochemistry, polymer science and life-science applications in particular.

Nanoindentation Tools - The Keysight’s nanoindentation systems are the world’s most accurate, flexible, and user-friendly instrument for micro-/nano-scale mechanical testing - Now powered by ultrafast and high-temperature nanoindentation capabilities for hardness and modulus measurement, as well as scratch and wear testing on an expanded range of materials.

Scanning Electron Microscopy - The innovative 8500B system is the world’s first compact field-emission scanning electron microscope (FE-SEM) designed specifically for low-voltage, high-resolution imaging applications in your own lab – PLUS quantitative energy dispersive spectroscopy (EDS) for advanced elemental analysis.
 

Research Resources

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Using High-Temperature Nanoindentation to Study Mechanical Properties of High-Entropy Alloys (HEA)
Nanoindentation studies of single-phase CoCrFeNi and dual-phase AlCrFeNiTi with faced centered cubic (FCC) and based centered cubic (BCC) structures at room and elevated temperatures

Application Note 2018-01-04

PDF PDF 3.65 MB
Studying Thermal Transitions of Materials Using Quick Scan Technology in Atomic Force Microscopy

Application Note 2017-12-22

PDF PDF 5.03 MB
High-Resolution Mechanical Mapping of High-Entropy Alloys at High Temperatures
Room and high-temperature mechanical properties of single-phase CoCrFeNi and dual-phase AlCrFeNiTi are statistically evaluated using the Keysight's G200 Express Test method.

Application Note 2017-12-21

PDF PDF 5.37 MB
【Battery Material Evaluation】Impedance Distribution Measurement Using High Frequencies Enables Obser

Brochure 2017-12-04

PDF PDF 448 KB
Using AFM and Nanoindentation Techniques for Comprehensive Nanomechanical Analysis of Materials
Comprehensive nanomechanical property studies of several polymer samples and metallic alloy of Bi/Sn are performed on both Keysight 9500 AFM and G200 Nanoindenter with good consistency in results.

Application Note 2017-11-21

PDF PDF 2.10 MB
Atomic Force Microscopy Studies of Materials in Different Vapor Environments - Application Note
Visualization of surface structures and examination of properties of polymers by Keysight 9500 AFM in various humidity and in vapors of different organic solvents.

Application Note 2017-11-08

PDF PDF 8.01 MB
5500 AFM Controller Upgrade - Data Sheet
Features of benefits of the digital controller with the 5500 AFM

Data Sheet 2017-10-26

PDF PDF 546 KB
9500 AFM - Data Sheet
Data sheet for the 9500AFM with quick Scan, New Nano Navigator software and New Auto Drive for quick automatic setting off parameters

Data Sheet 2017-10-26

PDF PDF 2.69 MB
Effect of Indenter Tip Heating in High-Temperature Nanoindentation Measurements - Application Note
Independently heating and monitoring the temperature of both indenter tip and sample helps determine high-temperature mechanical properties of materials using static/dynamic measurement methods.

Application Note 2017-09-27

PDF PDF 1.11 MB
Nano-Mechanical Measurements for Automotive Industry - Brochure
The Keysight Nano Indenter G200 provides the most comprehensive solutions of quantitative, high-throughput nanomechanical characterization for automotive industry.

Brochure 2017-09-13

PDF PDF 11.91 MB
Brittle-to-Ductile Plasticity Transition Behavior Study of Si by High-Temperature Nanoindentation
Nanomechanical response of single crystal silicon at various temperatures were studied using elevated temperature nanoindentation with Keysight G200 laser heater system.

Application Note 2017-08-21

PDF PDF 657 KB
Imaging with self-sensing cantilever on Keysight 5500/5600LS Atomic Force Microscopes - App Note
In this collaborative work, a brief technical background of self-sensing cantilevers and the developed Convert Unit for Keysight 5500/560LS AFM systems is introduced.

Application Note 2017-08-21

PDF PDF 5.16 MB
Wideband Electrostatic Force Microscopy (EFM): Broad Frequency Range with High Sensitivity -App Note
Wideband electrostatic force microscopy that extends the available EFM frequency range from the kHz to the GHz range as well as the measuring capabilities, which works in tapping or lift mode therefore reduces the tip wear and sample modifications.

Application Note 2017-08-21

PDF PDF 598 KB
Adopting Fast Imaging in Atomic Force Microscopy - Application Note
Fast imaging with Keysight 9500 AFM Quick Scan on multiple samples to demonstrate its capabilities for routine sample measurements with extremely improved productivity, as well as to provide the examples of visualization of several dynamic processes in different vapor environments.

Application Note 2017-08-18

PDF PDF 4.22 MB
Nano Indenter G200 - Data Sheet
Overview and specifications for the Nano Indenter G200

Data Sheet 2017-08-04

PDF PDF 1.72 MB
High-Temperature Nanoindentation on Pure Titanium (Ti) - Application Note
High-temperature mechanical properties of Pure Titanium was successfully tested by G200 Nano Indenter Laser Heater over a range of temperature from ambient to 500°C.

Application Note 2017-07-31

PDF PDF 524 KB
Laser Heated Tip and High Temperature Stage for G200 Nano Indenter - Data Sheet
General information and specifications for the G200 Nano Indenter Laser Heater Tip and Stage

Data Sheet 2017-07-06

PDF PDF 2.81 MB
AFM study of Structural Organization of Liquid Crystalline Oligomer - Application Note
Studies of liquid crystalline oligomer at different temperatures and in vapors of organic solvents using Keysight 9500 AFM.

Application Note 2017-06-15

PDF PDF 3.96 MB
Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

Application Note 2017-04-18

PDF PDF 1.80 MB
5500 Atomic Force Microscope (AFM) - Data Sheet
Data sheet for the 5500 AFM/SPM Microscope with features & benefits and options

Data Sheet 2017-03-29

5600LS High Resolution Large Stage AFM - Data Sheet

Data Sheet 2017-03-20

PDF PDF 4.85 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

Application Note 2017-03-09

PDF PDF 4.15 MB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

Application Note 2017-03-09

PDF PDF 6.24 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note
A study of polymers under different environments using the 9500

Application Note 2017-03-09

PDF PDF 5.29 MB
KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note
Explanation of two AFM modes used in automotive research for fuel cells

Application Note 2017-02-21

PDF PDF 1.75 MB

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