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Atomic Force Microscopes, FE-SEM, Nanoindenters, UTM

 

Accelerate Your Discovery with Comprehensive, Customizable Nanomeasurement Solutions from Keysight

Keysight Technologies, the winner of 2017 UNESCO Medal for Nanotechnologies Contributions, provides a wide range of high-performance nanoscale measurement instruments for research, industry and education. The applications cover most research fields including Chemistry, Materials Science, Chemical Engineering, Physics, Life Sciences, Semiconductors, Failure Analysis, etc.

Atomic Force Microscopy - Keysight offers a wide range of high-precision atomic force microscopes (AFM) to meet your unique research needs – no matter it is for high-resolution imaging, high-speed imaging or real-time, quantitative nanomechanical mapping capabilities. Our industry-leading environmental/temperature and fluid handling techniques enable superior control for electrochemistry, polymer science and life-science applications in particular.

Nanoindentation Tools - The Keysight’s nanoindentation systems are the world’s most accurate, flexible, and user-friendly instrument for micro-/nano-scale mechanical testing - Now powered by ultrafast and high-temperature nanoindentation capabilities for hardness and modulus measurement, as well as scratch and wear testing on an expanded range of materials.

Scanning Electron Microscopy - The innovative 8500B system is the world’s first compact field-emission scanning electron microscope (FE-SEM) designed specifically for low-voltage, high-resolution imaging applications in your own lab – PLUS quantitative energy dispersive spectroscopy (EDS) for advanced elemental analysis.
 

Research Resources

  • Nanoindenters Nanoindenters 

    Nanoindenters

    Nanoindenter technology provides the most advanced and dependable nano- and microscale material analysis available today.

  • AFM - Atomic Force Microscopes AFM - Atomic Force Microscopes 

    AFM - Atomic Force Microscopes

    A wide range of high-precision atomic force microscopes (AFM). Keysight's atomic force microscope (AFM) products are designed to meet your research needs.

  • Scanning Electron Microscopes Scanning Electron Microscopes 

    Scanning Electron Microscopes

    The new Keysight 8500B FE-SEM has been optimized for low-voltage high-resolution imaging and now has integrated energy dispersive spectroscopy (EDS).The 8500B delivers consistent, reproducible performance and the industry’s lowest cost of ownership.

  • Universal Testing Machine (UTM) Universal Testing Machine (UTM) 

    Universal Testing Machine (UTM)

    The Keysight universal testing machine (UTM) offers researchers a superior means of nanomechanical characterization.