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Discontinued Automated Test Equipment

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Medalist i1000D In-Circuit Test System - Data Sheet
The Keysight Medalist i1000D in-circuit tester (ICT) redefines digital testing by bringing electronics manufacturers easy to use and affordable testing for digital devices.

Data Sheet 2017-07-31

Converting Tescon Point 70 Fixtures and Programs for use on the Medalist i1000D
This application describes how users can convert their hardware and software from the Tescon Point 70 platform to the Keysight Medalist i1000D platform to enjoy state-of-the-art in-circuit test technology .

Application Note 2014-07-31

PDF PDF 8.81 MB
Learn more about Medalist In-Circuit and Manufacturing Functional Test Platforms
Request literature on ICT and MFT, In-Circuit Test and Manufacturing Functional Test Platforms

Brochure 2012-03-13

TestJet & VTEP hardware description and verification
This application note describes the TestJet and VTEP hardware components and the required connections for assembly on test fixtures. It also provides instructions for the setup and use of the Fixture Verifier.

Application Note 2010-12-22

Mentor Graphics Support of CAMCAD Pro - Letter
Letter: Agilent has decided to end its Reseller Contract with Mentor Graphics on Sales and Support of CAMCAD Pro to our customers. CAMCAD Pro converts CAD format to AOI, AXI and ICT input modules, and is a Mentor Graphics product.

Feature Story 2010-01-07

PDF PDF 62 KB
Comparing Contact Performance on PCBA using Conventional Testpads and Bead Probe
This white paper captures the details of an evaluation performed on the notebook motherboard of a leading Original Equipment Manufacturer using Keysight Medalist Bead Probes Technology.

Application Note 2008-10-31

PDF PDF 428 KB
Procedure to backup ITF3.1.1 Database and DataStore and Restore Them in a New ITF Server with SQL200
This document is targeted at users who are archiving historical data or migrating to a more powerful server utilized to run Keysight’s ITF.

Application Note 2008-07-28

PDF PDF 512 KB
Next Generation ICT Solutions for Limited Access Boards
Newer, more complex printed circuit boards are creating new challenges in test accessibility. Published with kind permission of Electronic Manufacturing

Article 2008-05-29

PDF PDF 816 KB
Troubleshooting Medalist Intelligent Test Framework Port Problems
This document serves as a guide/reference to do preliminary analysis and troubleshooting when network/communication problems occur with the ITF server of the tester agent.

Application Note 2008-05-22

PDF PDF 813 KB
Using Bead Probes to Increase Test Access
This case study discusses how Prodrive, a Netherlands-basedelectronics manufacturer, successfully implemented the Keysight Technologies Medalist Bead Probe Technology to complement their existing test strategies.

Data Sheet 2008-05-08

PDF PDF 366 KB
Medalist i1000 In-Circuit Test Solution Flash Demo
View the Keysight Medalist i1000 low cost ICT flash demo to see how this low cost solution offers you just enough test while giving you with extended test coverage capabilities that typical MDAs cannot provide.

Demo 2008-02-13

ZIP ZIP 46.08 KB
Medalist i1000 In-circuit Test Installation Manual
This guide describes how to install the Medalist i1000 In- circuit Test Systems. Procedures are provided for both the press down model (U9401A) and the vacuum model (U9402A).

Installation Manual 2007-09-01

Medalist i1000 In-circuit Test Operation Manual
The instructions in this guide are intended to help you work safely with the Keysight Medalist i1000 In-Circuit Test System.

Operation Manual 2007-09-01

Medalist i1000 In-circuit Test User Manual
This is a user reference manual for both the press down model (U9401A) and the vacuum model (U9402A).

User Manual 2007-09-01

CAD and Your Test System
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, November 2007.

Article 2007-08-11

PDF PDF 508 KB
Evolving Packages Drive Test and Inspection
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, March 2007

Article 2007-08-11

PDF PDF 747 KB
Medalist 3070 and Medalist i5000 System Recovery using Retrospect Express
This app note describes how to perform backups of the system hard disk for the Keysight Medalist 3070 and Keysight Medalist i5000 In-circuit Test systems that have been shipped with Retrospect Express 7.0 and Roxio Digital Media Plus 7.2 software.

Application Note 2007-07-10

PDF PDF 628 KB
Limited Access Testing
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, July 2007.

Article 2007-07-01

PDF PDF 137 KB
i5000 06.02p Software
The Keysight Medalist i5000 In-circuit test 06.02p adds intelligent Vectorless Test Extended Performance (iVTEP) to the software.

Release Notes 2006-09-01

Pb-Free’s Impacts on Test and Inspection
Written by Stig Oresjo, Agilent Technologies. Article published in Circuits Assembly, January 2005.

Article 2005-12-05

PDF PDF 75 KB
In-circuit Testing of Low Voltage Devices
Core technical document summarizing issues regarding the testing of low voltage devices on the 3070 and i5000, including updated Safeguard information.

Application Note 2005-05-25

PDF PDF 172 KB
ITF 3.1 File Directory Structure
This concise document provides information on the ITF3.1 File directory structure on the ITF server, Tester and Client applications (ART & AQT viewers).

User Manual 2005-04-04

PDF PDF 146 KB
ITF 3.1 Setup Guide
Provides instructions on how to install and configure the Intelligent Test Framework Server and ART/AQT Viewer Client applications.

Installation Manual 2005-04-01

PDF PDF 2.83 MB
ITF 3.1 Server Setup Guide
This guide provides a step-by-step procedure on how to set up your own File Server, starting with installing the OS, MS SQL and finally MTSS ITF software using a Compaq ML370 Server as an example.

Installation Manual 2005-04-01

PDF PDF 884 KB
Selcom Testimonial
Customer testimonial which discusses the advantages gained from using the Keysight Medalist Family of test and inspection systems.

Case Study 2005-03-14

WMF WMF 19.21 MB

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