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System Control Modules for 34980A

The 34980A System and Control modules provide additional measurement and control capabilities that are typically used in test applications. Choose from modules that include digital I/O with programmable polarity, D/A converter with onboard memory to create waveforms, and frequency counter/totalizers.

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Compare All System Control for 34980A (4)

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Basic Instruments Flyer: May - July 2019
This Basic Instruments flyer includes a promotion for a free scope probe.

Brochure 2019-03-19

PDF PDF 7.74 MB
34980A Multifunction Switch/Measure Unit Summary
Compact, economical one-box solution for medium to high-density switch/measure applications in design verification, automated test and data acquisition.

Technical Overview 2019-01-28

PDF PDF 1.49 MB
Practical Temperature Measurements (AN-290)
This application note explores the more common temperature measurement techniques and introduces procedures for improving their accuracy.

Application Note 2017-12-13

34980A Multifunction Switch/Measure Unit - User’s Guide
Getting Started, configuration, and programming information for the 34980A mainframe.

User Manual 2017-12-05

34980A Multifunction Switch/Measure Unit - Service Manual
Includes information on specifications, troubleshooting and diagnostics, calibration procedures, rack mounting, obtaining service, and much more.

Service Manual 2017-12-05

PDF PDF 9.51 MB
PXI & AXIe Instruments, Software, Reference Solutions and Services - Brochure
This brochure provides an overview of Keysight's PXI & AXIe instrument, software, solutions and services offering.

Brochure 2017-12-01

PDF PDF 2.32 MB
34980A Multifunction Switch/Measure Unit - Data Sheet
Description and technical specifications for the 34980A mainframe and plug-in modules.

Data Sheet 2017-09-11

34980A and L44xx Memory Clearing Procedure
This document contains detailed internal memory information for the 34980A multifunction switch/measure mainframe and modules and the L44xxA series LXI switch and control instruments.

Operation Manual 2015-07-23

PDF PDF 174 KB
Declaration of Conformity
Search Keysight Regulatory database for the most recent Declaration of Conformity statement for your product.

Reference Guide 2014-08-01

34959A Breadboard Module - User’s Guide
Configuration and programming information for the 34959A breadboard module. Edition 2.

User Manual 2014-08-01

PDF PDF 4.15 MB
34950A 64-Bit Digital I/O and Counter Module - User’s Guide
Configuration and programming information for the 34950A digital I/O and counter module. Edition 2 - September 2012.

User Manual 2014-08-01

PDF PDF 500 KB
34951A 4-Channel Isolated D/A Converter Module - User’s Guide
Configuration and programming information for the 34951A 4-channel D/A converter module. Edition 2 - September 2012.

User Manual 2014-08-01

PDF PDF 316 KB
34952A Multifunction Module - User’s Guide
Configuration and programming information for the 34952A multifunction module. Edition 2.

User Manual 2014-08-01

PDF PDF 288 KB
Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

The Benefits of Updating Your 3499A/B/C Switching System to the 34980A Switch/Measure Unit
This application note will describe differences and advantages of the new 34980A as compared to the 3499A/B/C.

Application Note 2013-08-15

34980A Programmer's Reference, Version 2.1
(Extract this zipped file to your local drive)This Help file contains reference information to help you program the Keysight 34980A over the remote interface using the SCPI programming language. The 34980A supports the SCPI command language on all of its remote I/O interfaces.

Help File 2013-01-29

ZIP ZIP 5.13 MB
Bench and System Switching Products
Whether you use switching to route signals for design verification applications or for complex automated functional test systems, reliable and repeatable switching is critical for your measurement accuracy.

Brochure 2012-04-27

PDF PDF 11.37 MB
Comparing the Keysight 34980A and PXI for Switch Measurement Applications
This application note provides a comparison between PXI cardcage solutions and a combined system, the Keysight 34980A switch/measure unit, so you can determine which platform best meets your needs for electronic functional test and data acquisition.

Application Note 2012-04-27

Efficient use of data logging and decision making w multiple scan lists
Basic data logging allows you to confi gure different measurements across multiple channels, then record the data.

Application Note 2010-04-07

PDF PDF 486 KB
Switch System Configurator
Use this configurator to define a switching solution with switches, controllers and accessories. Start by selecting if you want to use a Standard Platform, Build your Own with individual components or a Custom Solution

Selection Guide 2010-04-06

Types of Data Acquisition Architectures
To help you choose a system that meets your needs, this article explains the different types of data acquisition system architectures and explores some of the advantages and disadvantages.

Application Note 2010-02-01

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Tips for Optimizing Your Switch Matrix Performance
This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution.

Application Note 2009-10-22

High-Speed Scanning with the Keysight 34980A Multifunction Switch/Measure Mainframe and Modules
This application note explores components that affect the speed in a system. It also gives a breakdown of each component with SCPI language examples of how to set up the instrument for fast measurements that best fit your specific application.

Application Note 2008-11-26

Improve your data logging productvity using advanced limit testing
Improve your data logging productvity using advanced limit testing

Application Note 2008-10-30

PDF PDF 456 KB

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