Bit Error Ratio Test Solutions [Discontinued]

Product support information for your discontinued and obsolete Electrical and Optical Clock Data Recovery Solutions

Product support information and resources for discontinued and obsolete Serial BERTs

Product support information and resources for discontinued and obsolete ParBERT 81250

Product support information and resources for discontinued and obsolete Accessories and supplementary products for BERTs and Pulse Pattern Generators

Optical Transceiver Testing for Characterization

• 400/660 MHz / 1.32Gbit/s precision single-/dual-channel Pulse Data Generator
• Offers better delay than the 81110A.
• Offers better width accuracy than the 81110A

Keep pace with faster and more complex digital transmission systems with the 7 and 13 GHz serial Pulse Data Generators

Data sheet for the Keysight 81200 data generator/analyzer platform ( E4840A, E4849A and E48xxA modules)

The Keysight E2150B 43G Electrical/Optical BER Test System is a fully integrated turnkey scalable solution that provides electrical or optical streams up to 43Gb/s.

• 32 Gb/s Multiplexer 2:1
• Extends data rate of J-BERT M8020A to 32Gb/s and J-BERT N4903B pattern generator up to 28.4 Gb/s
• Optional de-emphasis up to 8 taps
• 2-slot AXI module
• Control from J-BERT user interface via USB

• Single instrument 3-slot wide PXI card containing pattern generation with error detection
• Bit error display over time
• Easily combined with DCA, Synthesizer, Pattern Generator or multiple BERT modules
• Automatic clock data align
• Jitter Bathtub display

• Recovers clock and demultiplexes data 1:2
• 32G version and 16.5G version available
• Tolerates small input signals
   

The N4906A Serial BERT is a 3.6 Gb/s general-purpose bit error ratio tester designed for high-speed digital components and systems.

• 0.5 to 16.0 GHz operation
• Jittered, non-jittered delayed and divided outputs
• Programmable patterns, large library of common stress patterns
• Fully supported in N4980A software
• SCPI command set for easy automation and test system integration