Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

Data Acquisition – DAQ

DAQ System – More than 25 years of Leadership

Keysight has provided data acquisition (DAQ) and switching solutions for more than 25 years. We provide data acquisition solutions for electrical, physical, mechanical, acoustic and signal routing applications up to 50GHz.

Compare data acquisition (DAQ) switch platforms

Define a switching solution with switches, controllers and accessories.

  • Get the Best Value with high quality switching and measurements in compact, cost effective solutions
  • Use on Industry Standards with modular LXI and VXI solutions
  • Use the Keysight’s Application Software to collect, analyze and present your data real-time

Check out Keysight next-generation multi-channel data acquisition (DAQ) system — sample more signals, faster!

Refine the List

remove all refinements

By Type of Content

By Product Category

1-18 of 18

Sort:
Recognizing and Reducing Data Acquisition Switching Transients - White Paper
Low impedance sources can produce large and fast current transients when switching; creating problems with adjacent channels, transients in the ground circuit that upset digital logic connected to the DUT, or causing the switch unit to reset or hang. This application note describes several techniques to reduce these switching transients.

Application Note 2019-09-27

Practical Temperature Measurements (AN-290)
This application note explores the more common temperature measurement techniques and introduces procedures for improving their accuracy.

Application Note 2017-12-13

Declaration of Conformity
Search Keysight Regulatory database for the most recent Declaration of Conformity statement for your product.

Reference Guide 2014-08-01

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

Efficient use of data logging and decision making w multiple scan lists
Basic data logging allows you to confi gure different measurements across multiple channels, then record the data.

Application Note 2010-04-07

PDF PDF 486 KB
Types of Data Acquisition Architectures
To help you choose a system that meets your needs, this article explains the different types of data acquisition system architectures and explores some of the advantages and disadvantages.

Application Note 2010-02-01

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Tips for Optimizing Your Switch Matrix Performance
This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution.

Application Note 2009-10-22

Responding to data logging events using action scripts
Combining data logging hardware and software can give you more techniques to automate extensive and repetitious measurements.

Application Note 2008-10-30

Improve your data logging productvity using advanced limit testing
Improve your data logging productvity using advanced limit testing

Application Note 2008-10-30

PDF PDF 456 KB
10-Tips Series: Get More From Your Switch/Measure Unit - Right From Your Computer Screen
Keysight Switch/Measure experts are introducing a new series of 10 short video clips that can help you improve productivity and increase results for your data acquisition or functional test applications.

Demo 2008-02-20

Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

Optimizing Test Systems for Highest Throughput, Lowest Cost and Easy LXI Instrument Integration
A new class of LXI instruments can save rack space, money and integration time over PXI. This application note discusses the tradeoffs and also explains how to optimize execution time through careful use of SCPI to avoid LAN latency issues.

Application Note 2006-03-23

Optimizing Throughput of Data Acquisition and Test Systems
Learn to speed up your test programs.

Demo 2005-08-31

LAN Connection using Telnet
When communicating with a LAN instrument using TELNET, do the following...

Application Note 2005-06-29

A Comparison of Leading Switch/Measure Solutions
This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments.

Application Note 2005-01-27

Direct instrument connection using LAN
If connecting directly to an instrument using LAN (rather than through a server) there are some steps that can be taken to make the initial connection faster and get you up-and-running more quickly.

Application Note 2004-11-01

Maximizing the Life Span of Your Relays (AN 1399)
This application note tells you how to maximize your relay's potential life by selecting the right relays for the type of measurements you are making.

Application Note 2002-06-11