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Data Acquisition – DAQ

DAQ System – More than 25 years of Leadership

Keysight Technologies has provided data acquisition (DAQ) and switching solutions for more than twenty-five years. We provide data acquisition solutions for electrical, physical, mechanical, acoustic and signal routing applications up to 50GHz.

Compare data acquisition (DAQ) switch platforms

Define a switching solution with switches, controllers and accessories.

  • Get the Best Value with high quality switching and measurements in compact, cost effective solutions
  • Use on Industry Standards with modular LXI and VXI solutions
  • Use the Keysight’s Application Software to collect, analyze and present your data real-time

Check out our next-generation multi-channel data acquisition (DAQ) system — sample more signals, faster!

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Power Handling Capability of Electromechanical Switches
This application note discusses the power handling of the hot switching and cold switching of EM switches.

Application Note 2019-02-13

Data Acquisition and Switching Platforms Select and Compare Table
Data Acquisition and Switching Platforms Select and Compare Table

Selection Guide 2018-11-01

Practical Temperature Measurements (AN-290)
This application note explores the more common temperature measurement techniques and introduces procedures for improving their accuracy.

Application Note 2017-12-13

Temperature Measurement Solution for Solar Cell and Module Testing - Application Note
This application note highlights key products that can be used to help you effectively and efficiently test solar cells and solar modules, and ensure that they are able to perform optimally.

Application Note 2017-10-25

Y1160A EIA Rack Sliding Shelf Installation Note
Edition 1. This installation kit contains procedures for mounting L4400 Series LXI instruments in EIA rack cabinets using the Y1160A sliding shelf rack mount kit.

Installation Manual 2015-07-28

PDF PDF 258 KB
L4400 Series Command Quick Reference
Version 1.0. Measurement commands, temperature commands, DAC configuration commands...

Reference Guide 2015-07-28

PDF PDF 139 KB
34980A and L44xx Memory Clearing Procedure
This document contains detailed internal memory information for the 34980A multifunction switch/measure mainframe and modules and the L44xxA series LXI switch and control instruments.

Operation Manual 2015-07-23

PDF PDF 174 KB
L4437A 32-Chan Form A/Form C General Purpose Switch - Data Sheet
Description and technical specifications for the L4437A 32-channel form A/form C general purpose switch.

Data Sheet 2014-12-02

L4400 Series LXI Compliant Instruments - User's Guide
Includes an introduction to the L4400 series product and modules, information on software installation and configuration, operating and programming, and calibration information.

User Manual 2014-08-01

PDF PDF 4.96 MB
Declaration of Conformity
Search Keysight Regulatory database for the most recent Declaration of Conformity statement for your product.

Reference Guide 2014-08-01

Characterizing the I-V Curve of Solar Cells and Modules
This measurement brief explores the various test and measurement tools you can use for I-V curve characterization and provides tips to help you choose the instrument or instruments that best fit your solar cell or module measurement needs.

Application Note 2014-07-31

34945A, L4445A and L4490A/L4491A - Configuration Guide
Introduction of the Keysight 34945A, L4445A, and L4490A/L4491A family of RF/Microwave switching instrument features, and assists in the three step process of selecting and configuring the systems.

Configuration Guide 2014-05-14

L4451A 4-Channel Isolated D/A Converter with Memory - Data Sheet
This data sheet provides technical specifications and other information about the Keysight L4451A 4-Channel Isolated D/A Converter with Memory.

Data Sheet 2013-10-15

L4452A Multifunction with Digital I/O, D/A, Totalizer - Data Sheet
Description and technical specifications for the L4452A Multifunction with 32-bit DIO, 2-ch D/A and totalizer.

Data Sheet 2013-10-11

L4450A 64-Bit Digital I/O with Memory and Counter - Data Sheet
This data sheet provides technical specifications and other information about the Keysight L4450A 64-Bit Digital I/O with Memory and Counter.

Data Sheet 2013-10-08

L4421A, 40 Channel, Armature Multiplexer - Data Sheet
This 9-page product overview of the Keysight L4421A 40-channel armature multiplexer contains product specifications as well as ordering information.

Data Sheet 2013-09-24

L4433A Dual/Quad 4x8 Reed Matrix - Data Sheet
Description and technical specifications for the L4433A dual / quad 4x8 reed matrix.

Data Sheet 2013-09-24

Bench and System Switching Products
Whether you use switching to route signals for design verification applications or for complex automated functional test systems, reliable and repeatable switching is critical for your measurement accuracy.

Brochure 2012-04-27

PDF PDF 11.37 MB
PXI Product on YouTube
PXI Product on YouTube

Demo 2011-12-22

Efficient use of data logging and decision making w multiple scan lists
Basic data logging allows you to confi gure different measurements across multiple channels, then record the data.

Application Note 2010-04-07

PDF PDF 486 KB
Types of Data Acquisition Architectures
To help you choose a system that meets your needs, this article explains the different types of data acquisition system architectures and explores some of the advantages and disadvantages.

Application Note 2010-02-01

Solar Cell and Module Testing
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Tips for Optimizing Your Switch Matrix Performance
This application note offers eight tips to help you optimize your measurement matrix switching performance and important features to remember when designing your switching solution.

Application Note 2009-10-22

Responding to data logging events using action scripts
Combining data logging hardware and software can give you more techniques to automate extensive and repetitious measurements.

Application Note 2008-10-30

Improve your data logging productvity using advanced limit testing
Improve your data logging productvity using advanced limit testing

Application Note 2008-10-30

PDF PDF 456 KB

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