Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

Discontinued Manufacturing Test Software Solutions

Keysight is exiting the automated optical and automated x-ray inspection business. Keysight will honor all existing warranty and support contracts and offer spare parts, time and materials services, and self support options until end-of-support, which is seven years from product discontinuance, starting March 1st, 2009.

For the list of frequently asked questions on this exit announcement, please visit www.keysight.com/find/inspection.

Keysight remains fully committed to expand the product offerings in its In-Circuit Test (ICT) and Functional Test product families in the printed circuit board assembly test market.

Refine the List

remove all refinements

By Type of Content

By Product Category

1-9 of 9

Sort:
CAD and Your Test System
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, November 2007.

Article 2007-08-11

PDF PDF 508 KB
Limited Access Testing
Written by Stacy Kalisz Johnson. Published with permission from Circuits Assembly, July 2007.

Article 2007-07-01

PDF PDF 137 KB
Pb-Free’s Impacts on Test and Inspection
Written by Stig Oresjo, Agilent Technologies. Article published in Circuits Assembly, January 2005.

Article 2005-12-05

PDF PDF 75 KB
Selcom Testimonial
Customer testimonial which discusses the advantages gained from using the Keysight Medalist Family of test and inspection systems.

Case Study 2005-03-14

WMF WMF 19.21 MB
Keysight Quality Tool Testimonials
Learn what users have to say about Keysight Quality Tool.

Case Study 2003-09-30

AwareTest xi Case Study #3
This case study compares fault coverage of the current test strategy (automatic optical inspection/full in-circuit test) with a combined x-ray inspection/simplified in-circuit test strategy.

Case Study 2003-02-15

PDF PDF 164 KB
AwareTest xi Case Study #2
This case study compares the current test strategy with a full combined test strategy and a simplified combined test strategy (x-ray inspection followed by simplified in-circuit test).

Case Study 2003-02-15

PDF PDF 763 KB
AwareTest xi Case Study #1
This case study compares a fully-probed in-circuit test on a conventional high node count test system with a combined x-ray/in-circuit test strategy, using the simplified in-circuit test.

Case Study 2003-02-15

PDF PDF 127 KB
Tackling Advanced Technology Boards: Combining X-ray and ICT
Written by By Ed Crane, Ed Kinney and Bill Jeffrey. Printed with permission from Circuits Assembly, September 1999.

Article 1999-09-01

PDF PDF 890 KB