Limited Access Test Products The Super 7 Suite
The world of electronics assembly continues to see complex packages, connectors and new high speed devices piled onto shrinking PCB real estate. It's more critical than ever to take stock of your In-Circuit Test needs to prepare for the future. Keysight's Super 7 suite of award-winning, limited-access test innovations are tools that can help you stay competitive:
- Cover-Extend Technology
- Bead Probe Technology
- IEEE 1149.1 InterconnectPlus Boundary Scan
- IEEE 1149.6 Boundary Scan
- Silicon Nails
- DriveThru
- Access Consultant
View our award-winning milestones
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Still using Keysight's old TestJet technology? It's time to upgrade to the highly versatile and powerful VTEP v2.0 Powered vectorless test suite!
Looking for a low-cost In-Circuit tester with digital capability? See our latest test system i1000D
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Access Consultant
Access Consultant
Software that ties all the different limited-access tools together to let you better manage which strategy suits your needs better
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Bead Probe Technology
Bead Probe Technology
Increase test access even on high-speed traces and space-constrain PCBAs. Its layout independent nature means that trace-routing is not disrupted with the addition of bead probes unlike how test pads do
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DriveThru
DriveThru
Used in conjunction with VTEP, DriveThru gives the user the ability to test both a device pin and the passive component leading to the device pin with just 1 test point
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IEEE 1149.1 InterconnectPlus Boundary Scan
IEEE 1149.1 InterconnectPlus Boundary Scan
Compliant to the IEEE 1149.1 standard, this Keysight boundary-scan solution provide a fast, automated pass/fail test along with pin-level diagnostics for speedy repair.
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IEEE 1149.6 Boundary Scan
IEEE 1149.6 Boundary Scan
Extend boundary scan to test high-speed AC-coupled differential signals in accordance to IEEE
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Silicon Nails
Silicon Nails
Test non-boundary scan devices by using devices which are boundary scan-enabled to act as driver/receivers.
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N1169A-003 Cover-Extend Technology
N1169A-003 Cover-Extend Technology
Hybrid technology between the VTEP vectorless capacitive coupling technology and boundary scan.
Related Industries & Technologies
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Boundary Scan & JTAG
Boundary Scan & JTAG
Keysight is committed to helping you succeed in adapting the latest boundary scan and JTAG innovations into your assembled PCB test strategies.
