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Low-leakage Switch Matrix Family (B2200A/B2201A/E5250A)

Industry Challenges

Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test.  Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution.  Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested.  This reduces both test time and cost.  Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.

Summary

Flexible switching matrix options, all without the compromise of distortion

The Keysight low leakage switch mainframes can expand the measurement capabilities of parameter analyzers (such as the Keysight B1500A, 4155C, or 4156C) to create an automated measurement solution. They provide the measurement flexibility and automation capabilities inherent in a switching matrix and probe-card-based solution without compromising measurement performance. The product family is designed with the flexibility to allow you to choose only the capabilities your testing needs require, nothing more. The portfolio contains multiple options for current measurement resolution and input/output configurations. In addition, all solutions include a powerful feature to compensate for the capacitance measurement distortion created by the matrix's internal path lengths.

  • Choose the measurement resolution that best matches your needs
    Choose between 1 fA and 10 fA current measurement resolution, as appropriate for your testing needs, to purchase no more sensitivity than is necessary. The switching matrix keeps pace with the capabilities of your semiconductor parameter analyzer without loss in measurement performance that might be caused by signal leakage.
  • Flexible input and output configurations
    Available options span the continuum of cost and performance, from cost-effective measurement solutions for non-Kelvin measurement up to 4-SMU, full-Kelvin measurement configurations. In addition, across the product family, you can select a variety of output channel configurations and card types to meet your measurement needs. The B2200A, B2201A, and E5250A (E5252A cards installed) support x12, x24, x36, and x48 output configurations. The E5250A (E5255A cards installed) supports x24, x48, x72, and x96 configurations, and up to 4 mainframes can be combined to create a 384-channel solution.
  • Accurate capacitance measurements without distortion
    When measuring capacitance, the cable length, which includes the path through the matrix, has a significant impact on measurement results. Keysight switching matrices have a capacitance measurement compensation feature that corrects for the error introduced by the matrix's internal path lengths. This allows you to make accurate capacitance measurements through a switching matrix, and -- unlike competitive solutions -- can supply compensation parameters to enable undistorted measurement results.

Compare All Low-Leakage Switch Matrices (3)

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The parametric Measurement Handbook, Rev 4
This 2018, Rev 4 handbook describes how to evaluate accurate current, voltage, or capacitance measurement by explaining parametric measurement basic

Brochure 2018-01-08

Impedance Measurement Handbook - 6th Edition - Application Note
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Application Note 2016-11-02

E5250A Low Leakage Switch Mainframe - Data Sheet
This data sheet includes a complete set of specifications and supplemental technical information.

Data Sheet 2015-11-19

B2200A/B2201A Switching Matrix User's Guide
Covers installation, front panel operation, programming examples, SCPI commands, VXIplug&play driver functions, and error messages.

User Manual 2015-09-01

E5250A Switching Matrix User's Guide
Covers installation, executing self-test and leak test, setup, controlling the E5250A, programming the E5250A, command reference, using the VXIplug&play driver, specifications, SCPI command reference, and error messages.

User Manual 2015-09-01

E5250A/B2201A/B2200A Low Leakage Switching Matrices - Brochure
This 12-page color brochure details the features and competitive advantages of the Keysight family of low-leakage switches. It also contains a switching solutions selection guide with basic technical specifications.

Brochure 2015-08-06

PDF PDF 2.76 MB
B2200A/BB2200A fA Leakage Switch Mainframe, B2201A 14ch Low Leakage Switch Mainframe - Data Sheet
Learn about technical specifications for B2200A and B2201A Switch Mainframe.

Data Sheet 2014-07-31

Low Current Measurement with AE5250A Switch Mainframe - Application Note
This application note introduces Keysight's new solution for precise characterization of multiple semiconductor devices by switching.

Application Note 2014-07-31

Creating a Test Sequence Using Keysight EasyEXPERT Software - Data Sheet
This 16-page application note demonstrates how a test sequence can be created using tests from the CMOS category using the furnished EasyEXPERT "Id-VD" and "Vth gmMax" application test definitions as an example.

Data Sheet 2014-07-31

Customizing Keysight B1500A EasyEXPERT Application Tests - Application Note
This six-page application note shows how easy it is to change the input parameter range in a furnished B1500A application test.

Application Note 2014-07-31

Evaluation of Hot Carrier Induced Degradation of MOSFET Devices - Application Note
This application note introduces you to Keysight’s new solution for evaluation of hot carrier induced degradation of multiple MOSFET devices.

Application Note 2014-07-31

Parametric Instrument Accessories Guide
This document provides comprehensive and detailed information on the accessories that are available for Keysight parametric measurement instruments.

Selection Guide 2013-12-09

Readme for VXIPlug&Play Driver Version A.04.00 for E5250A
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Release Notes 2011-12-19

Multifrequency C-V Measurements of Semiconductors (AN 369-5)
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Application Note 2008-12-10

Evaluation of MOS Capacitor Gate Oxide C-V Characteristics Using the Keysight 4294A(PN4294-3)
As a result of extremely high integration of logic LSIs, MOS FETs with gate lengths of 0.1 mm or less have been produced recently. A consequence of this miniaturization has been the need for very thin gate oxide layers.

Application Note 2003-06-26

How do I connect the GND unit Keysight 41501B with the Keysight E5250A?
How do I connect the GND unit Keysight 41501B with the Keysight E5250A?

Application Note 2002-12-18

PDF PDF 20 KB
How Do I Control the Keysight E5250A?
How Do I Control the Keysight E5250A?

Application Note 2002-12-18

HTML HTML 6 KB
What is the Keysight E5250A?
What is the Keysight E5250A?

Application Note 2002-12-18

PDF PDF 29 KB