Discontinued and Obsolete Parametric Test Equipment

The 4140B was discontinued on November 1, 2000 and became obsolete on January 1, 2006.

The 4142B was discontinued on July 1, 2003, and became obsolete on September 1, 2008.

The 4145A was discontinued on March 1, 1986 and became obsolete on November 1, 1993. The 4145B was discontinued in November 1, 1994 and became obsolete on November 1, 1999.

The 4155A, 4156A, and 41501A were discontinued on January 1, 1998 and became obsolete on January 31, 2003.

The 4155B and 4156B were discontinued on December 1, 2000 and became obsolete on February 1, 2006.

The 4280A was discontinued on November 1, 2000 and became obsolete on January 1, 2006.

The E5270A, E5272A, and E5273A were discontinued on November 1, 2004, and are under support through December 31, 2012.

The 4157B offers flexibility, expandability, and upgradeability in a PC-based measurement environment, providing a complete solution for parametric measurement and analysis.

VPA/PME helps you visually analyze, manipulate, manage, and re-use large quantities of test data, reducing parametric testing time in semiconductor process, development and integration environments.

The Keysight 41000 Series is a highly accurate CV-IV parametric measurement solution for the characterization of wafers in low-volume R&D, laboratory and process development environments.

A comprehensive set of instrument solutions for parametric test, usable standalone or through provided Windows-based software

• Measure all and CV parameters
• Easy to use and fully automated measurement
• Wide operation voltage up to 3 kV

Provides a broad range of system configurations to meet your production parametric testing needs.

Product information for discontinued flat panel display test systems

N9201A is an optional test system for both 4070 and 4080 series and provides you with greater throughput improvement.

Provides interactive and automated control of parametric instruments in a PC-based environment.

The ASUR (Advanced Scalable Unified Reliability) product family provides a range of semiconductor reliability test structures, measurement and analysis (C1280A, C1281A and C1282A).