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Discontinued and Obsolete Parametric Test Equipment

  • 4140B pA Meter / DC Voltage Source [Désuet] 4140B pA Meter / DC Voltage Source [Désuet] 

    4140B pA Meter / DC Voltage Source [Désuet]

    The 4140B was discontinued on November 1, 2000 and became obsolete on January 1, 2006.

  • 4142B Modular DC Source/Monitor [Désuet] 4142B Modular DC Source/Monitor [Désuet] 

    4142B Modular DC Source/Monitor [Désuet]

    The 4142B was discontinued on July 1, 2003, and became obsolete on September 1, 2008.

  • 4145A/B Semiconductor Parameter Analyzers [Désuet] 4145A/B Semiconductor Parameter Analyzers [Désuet] 

    4145A/B Semiconductor Parameter Analyzers [Désuet]

    The 4145A was discontinued on March 1, 1986 and became obsolete on November 1, 1993. The 4145B was discontinued in November 1, 1994 and became obsolete on November 1, 1999.

  • 4155A / 4156A / 41501A Semiconductor Parameter Analyzers [Désuet] 4155A / 4156A / 41501A Semiconductor Parameter Analyzers [Désuet] 

    4155A / 4156A / 41501A Semiconductor Parameter Analyzers [Désuet]

    The 4155A, 4156A, and 41501A were discontinued on January 1, 1998 and became obsolete on January 31, 2003.

  • 4155B / 4156B Semiconductor Parameter Analyzers [Désuet] 4155B / 4156B Semiconductor Parameter Analyzers [Désuet] 

    4155B / 4156B Semiconductor Parameter Analyzers [Désuet]

    The 4155B and 4156B were discontinued on December 1, 2000 and became obsolete on February 1, 2006.

  • 4280A 1 MHz C Meter / C-V Plotter [Désuet] 4280A 1 MHz C Meter / C-V Plotter [Désuet] 

    4280A 1 MHz C Meter / C-V Plotter [Désuet]

    The 4280A was discontinued on November 1, 2000 and became obsolete on January 1, 2006.

  • E5270A / E5272A / E5273A Parametric Measurement Solutions [Désuet] E5270A / E5272A / E5273A Parametric Measurement Solutions [Désuet] 

    E5270A / E5272A / E5273A Parametric Measurement Solutions [Désuet]

    The E5270A, E5272A, and E5273A were discontinued on November 1, 2004, and are under support through December 31, 2012.

  • 4157B Modular Semiconductor Parameter Analyzer [Désuet] 4157B Modular Semiconductor Parameter Analyzer [Désuet] 

    4157B Modular Semiconductor Parameter Analyzer [Désuet]

    The 4157B offers flexibility, expandability, and upgradeability in a PC-based measurement environment, providing a complete solution for parametric measurement and analysis.

  • VPA/PME Software [Désuet] VPA/PME Software [Désuet] 

    VPA/PME Software [Désuet]

    VPA/PME helps you visually analyze, manipulate, manage, and re-use large quantities of test data, reducing parametric testing time in semiconductor process, development and integration environments.

  • 41000 Series Integrated Parametric Analysis and Characterization Environment (iPACE) [Supprimé] 41000 Series Integrated Parametric Analysis and Characterization Environment (iPACE) [Supprimé] 

    41000 Series Integrated Parametric Analysis and Characterization Environment (iPACE) [Supprimé]

    The Keysight 41000 Series is a highly accurate CV-IV parametric measurement solution for the characterization of wafers in low-volume R&D, laboratory and process development environments.

  • 4155C / 4156C Semiconductor Parameter Analyzers [Supprimé] 4155C / 4156C Semiconductor Parameter Analyzers [Supprimé] 

    4155C / 4156C Semiconductor Parameter Analyzers [Supprimé]

    A comprehensive set of instrument solutions for parametric test, usable standalone or through provided Windows-based software

  • B1507A Power Device Capacitance Analyzer [Désuet] B1507A Power Device Capacitance Analyzer [Désuet] 

    B1507A Power Device Capacitance Analyzer [Désuet]

    • Measure all and CV parameters
    • Easy to use and fully automated measurement
    • Wide operation voltage up to 3 kV

  • Discontinued Parametric Test Systems [Supprimé] Discontinued Parametric Test Systems [Supprimé] 

    Discontinued Parametric Test Systems [Supprimé]

    Provides a broad range of system configurations to meet your production parametric testing needs.

  • Flat Panel Display Test Systems [Supprimé] Flat Panel Display Test Systems [Supprimé] 

    Flat Panel Display Test Systems [Supprimé]

    Product information for discontinued flat panel display test systems

  • N9201A Array Structure Parametric Test System [Désuet] N9201A Array Structure Parametric Test System [Désuet] 

    N9201A Array Structure Parametric Test System [Désuet]

    N9201A is an optional test system for both 4070 and 4080 series and provides you with greater throughput improvement.

  • Obsolete product - I/CV 3.0 Lite Automation Software [Desuet] Obsolete product - I/CV 3.0 Lite Automation Software [Desuet] 

    Obsolete product - I/CV 3.0 Lite Automation Software [Desuet]

    Provides interactive and automated control of parametric instruments in a PC-based environment.

  • Reliability Tests [Supprimé] Reliability Tests [Supprimé] 

    Reliability Tests [Supprimé]

    The ASUR (Advanced Scalable Unified Reliability) product family provides a range of semiconductor reliability test structures, measurement and analysis (C1280A, C1281A and C1282A).