Do You Face These Digital Test Challenges?

  • Test complexity and test times impacting time-to-market
  • Cost of high speed test equipment, setup, and expertise becoming greater
  • Risk of test accuracy accelerating as technology and standards evolve
  • Shortage of budget and technical resources

Unmatched Capabilities And Experts In Santa Clara, California

  • Real-time oscilloscopes up to 63 GHz
  • Optical sampling oscilloscopes up to 65 GHz
  • Electrical sampling oscilloscopes up to 110 GHz
  • Protocol aware receiver testing, link training, and link equalization up to 16 Gb/s
  • Stressed pattern generation in NRZ and PAM-4 modulation formats up to 64 Gbaud
  • Bit error ratio testing in NRZ and PAM-4 modulation formats up to 64 Gbaud
  • Arbitrary waveform generation up to 65 GSa/s

Standards-Based Testing Sample Capabilities

  • Display Port
  • Ethernet (1G/10G/100G/400G)
  • Fiber channel (up to 32GFC)
  • HDMI
  • PCIe
  • SAS
  • SATA
  • Thunderbolt
  • Type-C (not power delivery)
  • UFS
  • USB

Parametric Testing Sample Capabilities

  • Parametric analysis supported for optical and electrical signals in NRZ and PAM-4 modulation formats
  • Jitter analysis and decomposition
  • Signal parameters in time and frequency domain
  • Eye-opening, margin, and mask testing
  • Bit (BER), symbol (SER), and frame error (FER) rate
  • Output timing (Bathtub plot)
  • Extinction ratio (ER) and optical modulation amplitude (OMA)
  • TDEC and TDECQ

Custom Testing Sample Capabilities

  • Early technology test development
  • Test script and automation development
  • Custom algorithms and measurement science
  • Non-standardized interfaces
  • Custom reporting and data analytics

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