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Modular SMU Series (E5270B, E5260A, E5262A and E5263A)


Flexible solutions that lower cost-of-test for today's parametric measurement challenges

The wide range of available models and advanced measurement features provides a variety of price-performance points for parametric measurement and analysis. Modular product family members enable customization now and provide for future expansion as requirements change, while 2-channel units provide cost-effective solutions for simple test needs. The E5270B is targeted at precision semiconductor device characterization, and the E5260 Series (E5260A, E5262A, and E5263A) is targeted at high-speed production test. For all members of this product family, a number of innovative design elements -- such as expanded program memory -- help to improve the efficiency of complex testing. Cost-of-test is also lowered through superior measurement throughput, often several times faster than earlier instruments (such as the 4142B). The new 4.0 version of Keysight Desktop EasyEXPERT software can control the product family by using sample application tests on Desktop EasyEXPERT. The product family also gives you the option of using your own software.

  • Modularity enables customization now and provides for future expansion as requirements change
    The E5260A and E5270B both have a flexible and modular configuration with eight slots available for plug-in modules. The E5260A and E5270B support several source/monitor unit (SMU) types, with both products supporting a medium-power SMU (MPSMU) and a high-power SMU (HPSMU). [Note: The MPSMU and HPSMU modules are not interchangeable between these two products]. The E5270B additionally supports a high-resolution SMU (HRSMU) and an atto sense and switch unit (ASU). This flexibility enables you to tailor the selection of instrument mainframe and measurement modules to meet your exact testing requirements, but still provides you with the capability to expand and grow as your testing needs change in the future.
  • 2-channel instruments provide cost-effective solutions for simple test needs
    Many component measurements, such as laser diode and photo diode characterization, require only one or two SMUs. In these situations, the E5262A and E5263A models provide the ideal balance of price versus performance. Because both SMUs reside in the same mainframe, synchronization of the SMUs is automatic. You do not have to worry about synchronizing the SMUs as you would if you were using single SMUs.
  • Superior measurement throughput, several times better than earlier instruments
    The E5260A, E5262A and E5263A models all provide measurement performance that is 2-3 times faster than that of the Keysight 4142B. In addition, these units are code-compatible with the 4142B, allowing you to drop them right into your existing 4142B measurement environment with minimal code modification, realizing an immediate improvement in test throughput. The E5270B, while not as fast as the E5260 Series products, does provide a measurement speed improvement over the 4142B and it is also code-compatible.
  • Unsurpassed measurement performance (E5270B)
    The E5270B member of this product family provides unsurpassed DC voltage and current measurement. Both the MPSMU and HRSMU modules have a 0.5 microvolt voltage measurement resolution, as well as new 0.5 V and 5V measurement ranges that improve voltage measurement accuracy on modern semiconductor devices. The HRSMU module provides 1 femtoamp current measurement resolution without the need for any external preamplifiers. This innate capability allows you to meet the measurement challenges posed by the vast majority of current and future devices. The HRSMU accepts an optional external ASU that enables 0.1 femtoamp (100 attoamp) current measurement resolution, and also supports switching between capacitance meter-based (CV) and SMU-based (IV) measurements without the need to change any cables.
  • Improved testing efficiency through innovative features
    For all members of the product family, each SMU is equipped with its own analog-to-digital converter (ADC), which speeds up test times and even supports true parallel measurement. Program memory has also been enhanced to accelerate the measurement process, allowing you to reduce the number of commands sent across the GPIB bus. Engineers can take advantage of a simple front-panel interface to perform and report spot measurements and to view other items of interest (such as error messages) when debugging the instrument performance under automated control. All product family members also possess a 25-pin DIN connector that supports up to 8 trigger signals or 16 digital I/O lines, to support the most challenging triggering requirements.

Compare All Modular SMUs (4)

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1-25 of 29

The parametric Measurement Handbook, Rev 4
This 2018, Rev 4 handbook describes how to evaluate accurate current, voltage, or capacitance measurement by explaining parametric measurement basic

Brochure 2018-01-08

E5262A/E5263A Channel IV Analyzer/Source Monitor Unit - Data Sheet
This data sheet provides key features and specifications for the E5262A/E5263A 2 Channel IV Analyzer/ Source Monitor Unit for current-voltage characterization.

Data Sheet 2017-12-05

B1542A Pulsed IV Package User's Guide
Covers operation, installation, and reference information of Pulsed IV Package for B1500A/EasyEXPERT.

User Manual 2017-02-28

Benefit from Dramatic Improvements with a Transition from the 4155/4156 Analyzer Series
This technical overview introduces benefits of a transition from the 4155/4156 analyzer series to the most up to date analyzers.

Technical Overview 2016-03-08

Precision Current-Voltage Analyzer Series - Technical Overview
This literature is a technical overview to provide the brief information of precision current-voltage analyzer series, key features and specification, and differentiations.

Technical Overview 2016-02-05

E5270B Precision IV Analyzer/8 Slot Precision Measurement Mainframe - Data Sheet
This literature provides key features and specifications for the E5270B Precision IV Analyzer / 8 Slot Precision Measurement Mainframe for current-voltage characterization.

Data Sheet 2016-01-25

E5260A IV Analyzer/8 Slot High Speed Measurement Mainframe - Data Sheet
This data sheet provides key features and specifications for the E5260A IV Analyzer/8 Slot High speed Measurement Mainframe for current-voltage characterization.

Technical Overview 2016-01-25

E5260A/E5262A/E5263A/E5270B Precision IV Analyzer - Technical Overview
This technical overview introduces how to evaluate precision current-voltage characteristics using E5260A/E5262A/E5263A/E5270B Precision IV Analyzer series.

Technical Overview 2016-01-21

Precision Current-Voltage Analyzer Series - Selection Guide
The Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications.

Selection Guide 2016-01-21

Sheet Resistance/Resistivity Measurement Using a Source/Measurement Unit (SMU) - Application Note
This application note provides the technical information for the sheet resistance measurement using the precision current-voltage analyzer series.

Application Note 2016-01-14

Quick Start Guide for E5260/E5270 Series
A step-by-step guide to understand an overview of the E5260 series and the E5270B Precision IV analyzer and setup files used in it.

Quick Start Guide 2015-10-30

E5260/E5270 Parametric Measurement Solution User's Guide
User's Guide for E5270B/E5260A/E5262A/E5263A

User Manual 2015-09-01

E5260/E5270 Precision IV Analyzer Configuration and Connection Guide
This configuration guide will help you determine which modules, options and accessories to include with your E5260/E5270, and will also explain detailed connection with examples.

Configuration Guide 2015-07-06

E5270B Parametric Measurement Solution TIS User's Guide
TIS user's guide for E5270B

Programming and Syntax Guide 2014-10-31

E5260/E5270 Parametric Measurement Solution VXIplug&play Driver User's Guide
VXIplug&play Driver User's Guide for E5270B/E5260A/E5262A/E5263A

Programming and Syntax Guide 2014-10-31

E5260/E5270 Parametric Measurement Solution Programming Guide
Pogramming Guide for E5270B/E5260A/E5262A/E5263A

Programming and Syntax Guide 2014-10-31

16442B User Guide
Provides installation information, operation, maintenance information, and specification of the 16442B Test Fixture for B1500A, B2900 Series, and E5260/E5270 Series.

User Manual 2014-08-15

Top 5 Reasons to Use Keysight Precision SMU Products for Solar Cell Evaluation
Keysight Parameter & Device Analyzers can improve the yields and efficiencies of your solar cells.

Promotional Materials 2009-08-05

High Speed Modeling System with IC-CAP
Keysight has new modeling system configurations that meet the needs of advanced semiconductor processes.

Application Note 2008-08-21

Technical Overview :Technique for Controlling Keysight External DC Power Supply
Technique for Controlling Keysight External DC Power Supply From SMU to expand SMU output power capability.

Application Note 2006-08-01

16495C/D/E/F/G/H/J Connector Plate Installation Guide
Provides installation information of 16495 Connector Plate.

Installation Manual 2005-07-01

E5260 Series Quick Reference
A 2-page quick reference guide to using the E5260A/E5262A/E5263A from the front panel.

Quick Start Guide 2004-10-01

High Speed L-I-V Test of Laser Diode Using Keysight E5272A/E5273A AN E5270-4
This application note introduces a technique of programming for high speed L-I-V test of Laser Diode in production.

Application Note 2003-10-17

Evaluation of High Voltage Characteristics of Semiconductor Processes and Devices to 400V AN E5270-3
This application note introduces a technique for expanding the output voltage using the SMU of the Keysight E5270A 8-slot Parametric Measuremnet Mainframe.

Application Note 2003-10-06

E5270B Parametric Measurement Solution Quick Reference
A 2-page quick reference guide to using the E5270B from the front panel.

Quick Start Guide 2003-10-01


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