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W7301B PathWave IC-CAP Model Generator Plus
Modeling, Measurements, Programming, and Recentering to align the model to the new process targets
Vertrieben durch:
- Autorisierte Vertriebspartner
- Keysight Direct Sales
This bundle includes the Device Modeling Platform bundle and the W7008E Model Generator Recentering, enabling tuning and optimization techniques to efficiently adjust important parameters to adapt the model to the new targets.
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The W7301B PathWave IC-CAP Model Generator Plus includes:
- W7300B PathWave IC-CAP Device Modeling Platform with software environment, measurement drivers, optimization, the Python/PEL programming and simulation
- Easy import of target definition and data from different devices and temperature
- Easy creation of scaling plots of target Figures of Merits vs. geometry and temperature
- Full integration with the Model Generator enables custom extraction flow, verification, and report
- Visualization of Target Error table updated after tuning and optimization
- A total of 30-pk simulations for PathWave Advanced Design System (ADS)
This bundle adds the W7008E Model Generator Re-centering to the popular W7300B IC-CAP Device Modeling bundle. This super-bundle enables engineers to perform traditional and re-centering baseband and RF modeling. The W7300B provides the software environment, access to over 50 turn-key measurement drivers, optimization, the Python/PEL programming environment, the Model Generator, and several simulation links to commercial simulators.
The additional W7008E re-centering tool helps modeling engineers efficiently turn around updated model libraries whenever new specs are available. Re-centering uses tuning and optimization techniques to adjust important model parameters to align the model with the new targets. The tools provide the ability to adjust trend plots in real time and efficiently simulate data points from various devices and temperatures.
The re-centering tool guides you through the necessary steps, from importing targets to automatically setting up trend plots for tuning and optimization. Additionally, you can monitor overall errors through a convenient table and generate reports.
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