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N1953A Physical Layer Test System, 45 MHz to 20 GHz

Produkt Status

Obsolete

Technische Unterstützung

Kalibrierung und Reparatur

Service anfragen

Ersatzprodukt

N1953B Physical Layer Test System, 10 MHz to 20 GHz

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Optionen für Kauf oder Mieten

Überblick und Leistungsmerkmale
Upgrades nach dem Kauf
Ressourcen

HIGHLIGHTS

Powerful analysis tools include time-domain reflectometry (TDR), time-domain transmission (TDT), frequency-domain and eye diagrams
Complete characterization of single-ended, differential-mode, common-mode, and mode-conversion of your device
E8362B PNA series vector network analyzer with Option 014
RLCG parameter extraction allows creation of accurate transmission-line models for use in simulation programs such as HSPICE
N4419A 20 GHz test set
VNA´s > 70-dB dynamic range provides accurate characterization of your device
N1930A physical layer test system software
De-embedding removes test fixture effects from the measurement

The Keysight N1953A physical layer test system provides the highest accuracy and most comprehensive approach for characterizing single-ended or differential physical layer components such as high-speed backplanes, cables, connectors, packages, and controlled impedance traces on circuit boards.

The N1953A physical layer test system includes:

E8362B PNA series vector network analyzer with Option 014
N4419A 20 GHz test set
N1930A physical layer test system software

Note: Each component of physical layer test systems is available seperately if you already own a compatible vector network analyzer and would like to build a system. Please refer to the product overview for details.

Powerful analysis tools include time-domain reflectometry (TDR), time-domain transmission (TDT), frequency-domain and eye diagrams
Complete characterization of single-ended, differential-mode, common-mode, and mode-conversion of your device
RLCG parameter extraction allows creation of accurate transmission-line models for use in simulation programs such as HSPICE
VNA's > 70-dB dynamic range provides accurate characterization of your device
De-embedding removes test fixture effects from the measurement
Easy to use and intuitive Windows®-based user interface

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