Wir denken, das dies die Seite ist, die Sie sehen wollten.. Stattdessen Suchergebnisse ansehen:

Können wir Ihnen behilflich sein?

MXG Signal Generator UXA Signal Analyzer PXA Signal Analyzer Eine Lösung finden Technische Unterstützung An einem Training teilnehmen Unsere Teilnahme an Veranstaltungen finden Hochwertige Gebrauchtgeräte KeysightCare Online Kauf

No product matches found - System Exception

71612C Error Performance Analyzer

Produkt Status

Obsolete

Technische Unterstützung

Kalibrierung und Reparatur

Service anfragen

Ersatzprodukt

N4901B Serial BERT 13.5 Gb/s

Produktdetails anzeigen

Optionen für Kauf oder Mieten

Überblick und Leistungsmerkmale
Upgrades nach dem Kauf
Ressourcen

HIGHLIGHTS

Prove your design of lightwave and Gbit devices with confidence

The Keysight 71612C error performance analyzer is the ideal solution for the research, development and manufacturing test of Gbit lightwave and digital components, devices and subsystems from 100 Mb/s to 12.5 Gb/s.

With this high performance serial pattern generator and error detector, you can perform error analysis to verify the operation and quality of lightwave submarine cable systems, SONET/SDH telecom and datacom transceivers, Gbit datacom serial links, high-speed logic devices, and optical amplifiers and modulators.

The analyzer can be used to test 10.6 Gbit ethernet and forward error correction (FEC) rates giving you a breadth of applications to help you thoroughly test and characterize your devices for complete confidence in your product.

The four sub-rate outputs of the 71612C are suitable for the generation of 3.125 Gb/s test patterns required to test the XAUI interface of 10 Gigabit Ethernet devices. What's more, the 'alternate pattern mode' of operation allows synchronous selection of the de-skew and data patterns.

Generate exceptional waveforms even with reflective or poor terminations
Dedicate the analyzer's whole display for pattern editing
Simulate long distance testing using burst-mode gating in re-circulating loop tests
Quickly locate the optimum decision point in the eye waveform with auto-decision thresholds and phase alignment
Identify individual errored bits in custom patterns using error location analysis (ELA)
Display any bit in a custom pattern using the flexible pattern trigger
Automatically predict conventionally unmeasurable low BER using Q-factor measurement and eye-contour analysis
Generate real-life test patterns to stress your system-under-test
Create a cost effective 12.5 Gb/s frequency agile jitter measuring system
Convert electrical-to-optical and optical-to-electrical signals that are SONET/SDH compliant

Sortieren nach :

Datum

Datum Titel

Filter Results

No information found for this product

Zurücksetzen

Nach Inhaltsart