Column Control DTX
Accelerate the development of Next Generation Non-Volatile Memory

Accelerate the development of Next Generation Non-Volatile Memory

Applikationsberichte

For basic IV characterization to CV, pulsed IV measurement and reliability testing for flash and emerging NVM on a single instrument

B1500A semiconductor device parametric analyzer

Key features:

  • IV measurement ranges of 0.1 fA to 1 A and 0.5 μV to 200 V
  • AC capacitance measurement from 1 kHz to 5 MHz
  • Up to ± 40 V voltage pulse and arbitrary waveform generation
  • Automatic resource switching between IV measurement and pulse generation
  • Pulsed IV/Transient IV capability up to 200MSa/s without load line effect

Benefits:

  • Accurately measure the IV and CV curve, supporting automated parameter extraction
  • Quickly and easily perform reliability test such as endurance and retention by automatically switching between pulse stress cycle and IV measurement
  • Precisely perform advanced measurements such as NBTI/ PBTI, RTN (Random Telegraph Noise) ) using pulsed IV/ transient IV capability

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Column Control DTX