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X-Series Measurement Applications

Phase Noise Measurement Application, Multi-touch UI

Este pacote faz parte de Aplicativos PathWave da série X

Instalável em: Instrumento


Principais características

  • 30-Day Free Trial for X-Series Measurement Applications
  • Provide one-button measurements for analyzing phase noise in frequency domain (log plot) and time domain (spot frequency)
  • Log plot measurements: provides phase noise view in frequency domain including DANL floor and integrated noise measurements along with spurious table
  • Spot frequency measurements: provides phase noise view in time domain including carrier frequency drift measurement
  • Monitor spectrum: provides easy-to-use simple spectrum view for a quick check of your signal
  • IQ waveform measurements: provide easy-to-use simple time domain view
  • Performance:
    - Phase noise density accuracy: up to ±0.20 dB
    - Offset frequency accuracy: ±0.5 %
    - Base instrument phase noise (typical with center frequency = 1 GHz) -128 dBc/Hz
  • Support multi-touch user interface and SCPI remote interface programming
  • KeysightCare software support subscription included

Este pacote inclui

  • N9068EM0E X-Series measurement application license for phase noise measurements with multi-touch UI
  • Phase noise measurement application software subscription and support (12-month)

 

Requisitos do sistema

Instrument Compatibility

Este pacote é parte de...

Aplicativos PathWave da série X — A oferta de aplicativos de medição mais abrangente da indústria para analisadores de sinal de bancada e modulares para comunicações celulares, conectividade sem fio, aeroespacial/defesa e de uso geral.


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