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Application Notes 2020.04.24
Better Satellite Link Distortion Testing Using Spectral Correlation Method
Isolate And Measure Distortion
System designers rely on three key metrics — noise power ratio (NPR), adjacent channel power ratio (ACPR), and error vector magnitude (EVM) — to describe wideband distortion in their components or systems. Each of these methods is useful, but none provides a complete picture. The modulation distortion application for the PNA-X Vector Network Analyzer delivers the ability to do spectral correlation. This application note details how you can isolate and measure the distortion of a device under test (DUT) using spectral correlation and real-world test signals.
Download this application note to find out how you can:
- Implement this vector network analyzer (VNA) based approach
- Reduce or compensate for signal distortion
- Achieve accurate modulated measurements at the radio and millimeter-wave frequencies
Get To Know The Application
The S93070xB Modulation Distortion Application combined with the PNA-X Vector Network Analyzer and a Vector Signal Generator (VSG) enable users to measure the nonlinear behavior of power amplifiers under wideband modulated stimulus conditions. This new frequency-domain measurement method delivers low residual error vector magnitude (EVM) and rapid EVM measurement speed. The VNA-based vector calibration extends the reference planes of the signal generator and the analyzer to the device under test (DUT) planes, providing superior signal fidelity and accurate modulated measurements.
N5247B PNA-X Vector Network Analyzer
Test nonlinear amplifier characteristics
and noise figure
M9384B VXG Microwave Signal Generator
Execute power amplifier measurements with wideband mmWave signal generation
Agile Vector Adapter
Access multiple channel and port configurations from a single source
M9383A PXIe Microwave Signal Generator
Customize your test solution for applications from 1 MHz to 44 GHz
S930707B Modulation Distortion Application
Isolate and measure the distortion of only the device under test