From Modular to Integrated: DS1060A Pattern-Based Trigger Generator

Embedded security testing often involves a mix of precise experiments, repeated measurements, and frequent changes in setup. As labs grow and test scopes expand, the number of instruments, cables, and software components tends to grow with them.

The DS1060A Pattern-Based Trigger Generator is the PXIe device in our Next-Generation Embedded Security Testbench. The DS1060A PXI card is designed to replace the need for an external oscilloscope for targets up to 1 GHz. Combined with the PXIe chassis and embedded controller, it also eliminates the need for a separate workstation. With Inspector software running on the embedded controller, the result is a compact, scalable, and future-ready solution for high-performance security testing.

From External Unit to PXIe Card

Previously, our setup relied on a DS1002A Pattern-Based Trigger Generator box paired with a separate DS1001A Transceiver. While effective, this configuration required manual setup and multiple components, which added complexity and slowed down workflows.

With the DS1060A module, triggering is implemented directly in the PXIe architecture. This streamlines the entire experience, reducing clutter, improving reliability, and accelerating setup times. The result is a smoother, more advanced testing environment that empowers security professionals to focus on testing and analysis instead of setup overhead.

Key Capabilities

The DS1060A helps security teams precisely control when and how they inject faults or capture side-channel signals during testing. It serves as a precision timing coordinator, ensuring your measurements happen at exactly the right moment — a critical requirement when testing the security of a chip or embedded device.

With a maximum pattern size of 32,768 samples and a 4.8 GSa/s sampling rate — up to 32 times greater than previous models — the DS1060A enables high-resolution, high-speed testing across a wide range of scenarios. Its integrated downconverter supports frequencies up to 2.4 GHz. For higher bandwidth needs, the PXIe platform allows seamless integration with other Keysight modules, such as the M5201A PXIe Down Converter, scaling up to 16 GHz.

Key Benefits:

• Faster time-to-insight: Spend less time on setup and more time analyzing.
• Higher confidence in results: Precise triggers support more accurate vulnerability detection.
• Lower operational overhead: Fewer devices, fewer cables, and fewer potential points of failure.

Unified Security Testing Platform

The DS1060A Pattern-Based Trigger Generator is part of the DS1050A Embedded Security Testbench that includes the M9046A PXIe Chassis, M9038A Embedded Controller, and Inspector Software. Together, they form a compact, high-performance PXI testbench that simplifies lab setup and accelerates testing workflows. With the DS1060A replacing the need for an external oscilloscope for targets up to 1 GHz, and the embedded controller providing the computing power required to run Inspector in a headless configuration, fewer components are needed. Inspector Software offers a centralized interface for test control, visualization, and data analysis, bringing everything together in one streamlined environment. Fewer parts mean faster communication, reduced setup complexity, and improved system reliability for advanced security testing.

Device Security Solution

Power Solution

Power Side Channel Analysis (SCA)

Measures subtle changes in a device’s power consumption to detect if sensitive data, like cryptographic keys, can be unintentionally exposed. It’s a proven method to assess how well a device resists real-world leakage threats.

Power Fault Injection (FI)

Applies controlled power glitches to test how a device behaves under stress. This helps uncover weaknesses in secure boot, authentication, and other critical operations that could be exploited.

Electromagnetic (EM) Solution

EM Side Channel Analysis (SCA)

Captures electromagnetic emissions from a device to identify potential data leakage. It’s especially useful for non-invasive testing of compact or shielded systems.

EM Fault Injection (FI)

Uses targeted EM pulses to disrupt device behavior and expose hidden vulnerabilities. This technique is effective for testing fault tolerance without physical contact.

Laser (Optical) Solution

Laser Side Channel Analysis (SCA)

Uses Failure Analysis techniques such as Emission Microscopy (EMMI), Optical Beam Induced Current (OBIC), and Thermal Laser Stimulation (TLS), combined with laser-based methods, to monitor how a device emits signals during operation. This approach offers high spatial resolution and control, making it ideal for pinpointing leakage in secure elements, chips, or high-assurance systems where precision matters most.

Laser Fault Injection (FI)

Uses laser-based techniques to inject faults and observe how the device behaves under extreme, targeted conditions. This method offers the highest level of precision and control, making it ideal for advanced labs testing secure elements, chips, or high-assurance systems.

Whether you're starting fresh or building toward full-spectrum testing capabilities, the DS1060A, alongside the PXIe chassis, embedded controller, and Inspector software, forms the foundation of a scalable, future-ready testbench. It’s designed to grow with your needs and adapt to evolving attack vectors across power, electromagnetic, and optical domains.

Built for the Future of Security Testing

Whether you're working to secure embedded systems, AI chips, or defense-grade equipment, this PXIe card helps you stay ahead of threats with confidence and efficiency. Designed to support both Keysight Inspector Side Channel Analysis (SCA) and Fault Injection (FI) workflows, the DS1060A empowers your team to conduct advanced cryptanalysis, fault simulation, and data acquisition, all within a single, integrated environment.

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