8590EM Series vs 8590E Series with 85712D DLP |
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8590EM Series | 8590E Series with 85712D |
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Real-time log frequency sweep which is very helpful for conducted emissions measurements. | There is a static log graph which is available. |
Two limit lines and margins which is convenient for requirements that have both quasi-peak and average limits. | There is one limit line and margin. |
Built-in average detector. | The video filter is used to perform average detection. |
Up to 239 signals can be measured and stored to the internal list. | Only 20 signals can be measured and stored to the internal list. |
The internal list has sorting, editing, and re-measurement capability. | There is no sorting, editing, or re-measurement capability. |
There are 4 sets of individual correction factors which can be sumed together and applied "real-time" to the display. | There is 1 set of correction factors which is applied to the display. |
IF overload detection and autoranging to adjust the reference level to compensate for large signals. | No IF overload detection or autoranging available. |
Perform stepped measurements on broadband signals to get peak, quasi-peak, and average measurements over a broad span. | No stepped measurement available. |
Print a complete report including signal list, graphics, instrument setup, and a full page of text. | Print 1 page of graphics or the 20 signal list. |
The IF bandwidths and the frequency bands are coupled to insure accurate measurements. | No IF bandwidth to frequency coupling. |
Configure the output of the table to include your choice of peak, quasi-peak, average, difference to limit, correction factors, and marked signals. | The output of the 20 signal list is not configurable. |
The windows functionality is integrated into the measurement capability. | The windows functioanlity is turned off when any DLP is activated in the 8590E series. |
All functions are intergated into the instruments software, so no DLP is required to be loaded to perform the measurements. | The personality card is required for the measurements. |