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W-CDMA Dynamic Power Analysis Using the 8960 - Application Note
This document illustrates how to use the dynamic power analysis measurement in the Keysight 8960 test set to measure user equipment (UE) power sequences.

應用手冊 2015-07-31

PDF PDF 379 KB
Making EMI Compliance Measurements - Application Note
This application note provides an overview of EMI compliance test requirements and measurement approaches.

應用手冊 2015-07-25

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range -- Application Note
The dynamic range of a spectrum analyzer is traditionally defined as the ratio, in dB, of the largest to the smallest signals simultaneously present at the input of the spectrum analyzer that allows measurement of the smaller to a given degree of uncertainty. The signals of interest can either be...

應用手冊 2015-07-24

Optimizing RF and Microwave Spectrum Analyzer Dynamic Range - Application Note
This application note defines the elements of spectrum analyzer measurement speed and shows how to choose solution bandwidth and data output format for fast measurements.

應用手冊 2015-07-22

Dynamic Power Measurements for cdma2000 on the Keysight 8960 Wireless Test Set - Application Note
Power control is essential in CDMA devices. This application note explains how the use of dynamic power measurement can help ensure the in-field performance of CDMA wireless devices.

應用手冊 2015-07-15

New Pulse Analysis Techniques for Radar and EW - Application Note
This app note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

應用手冊 2015-07-12

PDF PDF 2.86 MB
認識向量網路分析的基本原理 - 應用說明
本應用說明將回顧向量網路分析的基本原理,討論的內容包括可量測的通用參數,並解釋散射參數(S 參數)的概念。本文並探討一些射頻基本知識,如傳輸線和史密斯圖(Smith Chart)。

應用手冊 2015-06-09

Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Using Keysight E5071C ENA Network Analyzer Option TDR

應用手冊 2015-06-05

PDF PDF 1.43 MB
Noise Figure Uncertainty Calculator
The noise figure uncertainty calculator has been created to aid your design work, from components through to systems, helping you meet the continued demand for higher system performance.

分析工具 2015-05-29

Power Supply Control Loop Response (Bode Plot) Measurements - Application Note
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes

應用手冊 2015-05-21

PDF PDF 1.60 MB
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

應用手冊 2015-05-01

PDF PDF 2.46 MB
Basics of Measuring the Dielectric Properties of Materials - Application Note
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

應用手冊 2015-04-27

A Flexible Test Solution for 2.4 GHz ZigBee Transmitter and Receivers - Application Note
This application note explains a low cost measurement solution for 2.4 GHz ZigBee O-QPSK signal generation for receiver test and signal analysis for transmitter test

應用手冊 2015-04-17

Radar Development Using Model-Based Engineering
This application note describes how SystemVue is well suited for use in model-based engineering. It is for system engineers, directors of engineering and people involved in the development of Radar.

應用手冊 2015-04-14

PDF PDF 1.59 MB
Keysight Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests
Keysight Method of Implementation (MOI) for 100BASE-TX Cable Tests Using Keysight E5071C ENA Option TDR

應用手冊 2015-04-07

PDF PDF 2.12 MB
100 Gb/s Ethernet 100GBASE-CR4 Test Points and Test Fixtures - Application Note
This application note provides a detailed technical overview of 100GBASE-CR4 test point specifications and test fixtures to implement testing of physical media signals at the MDI and cable assemblies.

應用手冊 2015-04-01

PDF PDF 1.71 MB
Testing New-Generation WLAN 802.11ac - Application Note
This application note introduces the new WLAN new-generation testing technology of 802.11ac and the many different Keysight solutions for testing WLAN 802.11ac.

應用手冊 2015-04-01

Using Microprobing, Modeling and Error Correction to Optimize Channel Design - Application Note
This application note will discuss step-by-step channel analysis methodologies using microprobing measurements with simulation and modeling tools to show accurate results to 20 GHz.

應用手冊 2015-03-27

PDF PDF 1.08 MB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

應用手冊 2015-03-26

PDF PDF 700 KB
Achieving Higher Measurement Accuracy & Better Correlation for PCB Impedance Test - Application Note
Traditional method for PCB impedance measurements is difficult to meet accuracy required today. Measurement with full calibration is introduced to meet accuracy for the latest PCB impedance test.

應用手冊 2015-03-24

Performing LTE & LTE-Advanced RF Measurements with E7515A UXM Wireless Test Set - Application Note
This application note provides insights into example test procedures for RF testing of LTE and LTE-A UEs based on 3GPP TS 36.521-1 V12.2.0 (2014-06).

應用手冊 2015-03-24

PDF PDF 9.75 MB
Power Supply Rejection Ratio (PSRR) Measurements - Application Note
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

應用手冊 2015-03-24

PDF PDF 1.52 MB
Oscilloscopes in Aerospace/Defense Debugging MIL-STD 1553 serial buses - Brochure
Keysight's InfiniiVision 3000 X-Series oscilloscopes provide MIL-STD 1553 triggering and decoding, as well as eye-diagram mask test capability to help you debug your MIL-STD 1553 buses faster.

應用手冊 2015-03-23

Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note
Learn about CAN-dbc symbolic triggering and how to improve debug of your automotive designs using an oscilloscope.

應用手冊 2015-03-13

Solutions for Testing Data Throughput Performance in LTE-A User Equipment - Application Note
This application note is designed to provide into a simplified, real-world functional and RF test of LTE-A UE performance using a fast, flexible and future-ready one-box tester (OBT)

應用手冊 2015-03-11

PDF PDF 3.60 MB

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