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|EXT Wireless Communications Test Set Non-signaling Test Overview
This application note explains how non-signaling test methods make it possible for manufacturers to reduce both test times and test equipment costs across a range of wireless technologies
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|Testing Handovers Between LTE and 3G cdma2000/1xEV-DO Cellular Networks - Application Note
This application note explains test handovers between LTE and third generation cdma2000/1xEV-DO cellular networks as well as network evolution.
|Applications Testing with the Keysight 8960 Series 10 Wireless Test Set (R&D only) - Application Note
The 8960 (E5515C) and Keysight lab applications help you throroughly test to current technology standards.
|How Digitally Generated Faded Signals Reduce Cost of Test (R&D only) - Application Note
Reduce cost of test, simplify testing and be assured of accuracy using digitally integrated, calibrated noise and fading patterns.
|Understanding Measurement of 1xEV-DO Access Terminals (AN 1414)
Basic concepts of 1xEV-DO, Forward link receiver measurements, Reverse link, and more...