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Типовые решения на базе модульных приборов

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Если вам требуется система для решения сложных задач тестирования, компания Keysight готова поделиться своим богатым опытом в области измерений, создания модульных приборов в формате PXI и автоматизации испытаний.

При решении специализированных задач компания Keysight и ее партнеры помогут вам подобрать компоненты и выполнить интеграцию испытательной системы в формате PXI.
Приведенные ниже примеры решений в формате PXI разработаны для использования в конкретных приложениях и оптимально используют масштабируемость PXI системы, ее габаритные размеры и производительность. Каждое решение может быть легко адаптировано для ваших требований к проведению испытаний. Ознакомьтесь с модульными системами компании Keysight и посмотрите, как они помогают расширить границы тестирования.

  • 5G Channel Sounding, Reference Solution 5G Channel Sounding, Reference Solution 

    5G Channel Sounding, Reference Solution

    • Signal generation up to 44 GHz w/ 2 GHz modulation BW
    • Signal analysis up to 50 GHz w/ 1 GHz analysis BW
    • Chan-to-Chan phase coherence < 1 deg, nominal
    • On-board FPGAs, real-time data processing, up to 250 MB/s per-chan streaming to RAID

  • 5G Waveform Generation and Analysis Testbed, Reference Solution 5G Waveform Generation and Analysis Testbed, Reference Solution 

    5G Waveform Generation and Analysis Testbed, Reference Solution

    • Generate and analyze candidate 5G waveforms: custom IQ, OFDM, FBMC
    • Scalable modulation bandwidths and frequency bands
    • Supports many topologies for transmitter/receiver testing (IQ, IF, RF, microwave, millimeter-wave)

  • 802.11ad Testbed, Reference Solution 802.11ad Testbed, Reference Solution 

    802.11ad Testbed, Reference Solution

    • Generate/analyze coded 802.11ad waveforms w/ flexible parameters
    • Precorrect waveforms, I/Q imbalances & channel response
    • Supports topologies, Tx/Rx testing (IQ, IF, RF, microwave, mm-wave)
    • Independent reference, debug & validate hardware

  • DDR4 Functional/Protocol Debug and Analysis Reference Solution DDR4 Functional/Protocol Debug and Analysis Reference Solution 

    DDR4 Functional/Protocol Debug and Analysis Reference Solution

    • Confidently follow signal flow in your system to resolve issues
    • Validate protocol compliance and accurately identify failures
    • Anticipate signal integrity issues with bus level signal integrity insight
       

  • DDR4 Parametric Test Reference Solution DDR4 Parametric Test Reference Solution 

    DDR4 Parametric Test Reference Solution

    • Complete DDR4 debug, analysis and compliance testing
    • 100% parametric test coverage in accordance to JEDEC specifications
    • Fast DDR4 protocol decode capability
    • Superior signal integrity BGA probing
       

  • Digital Interconnect Test System, Reference Solution Digital Interconnect Test System, Reference Solution 

    Digital Interconnect Test System, Reference Solution

    • Provides full signal integrity analysis of high-speed digital interconnects up to 32-ports
    • Performs multi-domain analysis including time, frequency, eye diagrams, crosstalk, skew and much more
    • PLTS with API provides fast and easy measurements

  • Digital Interconnect Test System, Reference Solution Digital Interconnect Test System, Reference Solution 

    Digital Interconnect Test System, Reference Solution

    • Provides full signal integrity analysis of high-speed digital interconnects up to 32-ports
    • Performs multi-domain analysis including time, frequency, eye diagrams, crosstalk, skew and much more
    • PLTS with API provides fast and easy measurements

  • E-Band Signal Analysis Reference Solution E-Band Signal Analysis Reference Solution 

    E-Band Signal Analysis Reference Solution

    • mmW modulation bandwidth up to 2.5 GHz
    • 55/60 GHz to 90 GHz E-band frequency range coverage
    • Baseband / IF analysis frequency range coverage up to 33 GHz
    • Lower-cost E-band analysis capability
       

  • LTE/LTE-Advanced Multi-Channel, Reference Solution LTE/LTE-Advanced Multi-Channel, Reference Solution 

    LTE/LTE-Advanced Multi-Channel, Reference Solution

    • Up to 4x4 time synchronized MIMO
    • 1 MHz to 3 GHz or 6 GHz
    • Up to 160 MHz
    • < 20 ns channel-to-channel synchronization

  • Multi-Channel Antenna Calibration, Reference Solution Multi-Channel Antenna Calibration, Reference Solution 

    Multi-Channel Antenna Calibration, Reference Solution

    A multi-channel antenna test reference solution provides narrow-band antenna calibration: scalable channel count, antenna receive channels downconversion options, selectable analysis BW, and RF/microwave sources/LO choices.

  • Multi-Emitter Scenario Generator, Reference Solution Multi-Emitter Scenario Generator, Reference Solution 

    Multi-Emitter Scenario Generator, Reference Solution

    • 10 MHz to 40 GHz
    • Fast frequency switching and amplitude settling: < 180 ns in list mode (frequency, amplitude, phase)
    • Minimum pulse width: 10 ns
    • Linear chirp width: 10 to 25% of center frequency

  • Power Integrity Analyzer Reference Solution Power Integrity Analyzer Reference Solution 

    Power Integrity Analyzer Reference Solution

    • Solutions optimized to measure power rail noise
    • Easy and efficient debugging solutions for power quality analysis
    • Supports up to ± 24 V offset
       

  • Radio Test Solution Radio Test Solution 

    Radio Test Solution

    • RF and audio signal generation and analysis
    • AM/FM, APCO P25, Tetra, DMR, dPMR, ARIB T98/T61/T102, NXDN
    • Tx and Rx measurements: hum and noise, harmonics and spur, SINAD and THD, SNR, sensitivity, and modulation quality

  • Remote Radio Head Test, Reference Solution Remote Radio Head Test, Reference Solution 

    Remote Radio Head Test, Reference Solution

    • Increase test throughput
    • Reduce overall cost and resources
    • Gain confidence using CPRI with a comprehensive solution

  • Satellite Signal Monitoring, Reference Solution Satellite Signal Monitoring, Reference Solution 

    Satellite Signal Monitoring, Reference Solution

    • Shared 27 GHz VSA, multi-band, power spectrum scanning & digital demodulation
    • Low power and weight
    • Cost efficient
    • Easy to scale # of scanned bands
    • Also available w/ 27 GHz VSA each band, parallel acquisitions all bands

  • Small Cell Test, Reference Solution Small Cell Test, Reference Solution 

    Small Cell Test, Reference Solution

    • Cellular: UMTS, LTE FDD, LTE TDD
    • Wireless Connectivity: WLAN

  • VoLTE Battery Test, Reference Solution VoLTE Battery Test, Reference Solution 

    VoLTE Battery Test, Reference Solution

    • Simplified product structure
    • Fully compliant w/ VoLTE battery test plans
    • Automation test scripts: multiple radio access technologies, protocol logging tool, IMS/SIP environment, battery drain test w/ DC power source, modules & analysis software

  • Wideband Signal Analysis for Satellite Test, Reference Solution Wideband Signal Analysis for Satellite Test, Reference Solution 

    Wideband Signal Analysis for Satellite Test, Reference Solution

    • Up to 50 GHz
    • > 1 GHz analysis bandwidth
    • Analyze & demodulate both commercial or custom formats
    • Integrated record & playback of IQ data
    • High performance: aerospace, defense, commercial communications & more

  • S5020A FD-MIMO Multi-Channel, Reference Solution S5020A FD-MIMO Multi-Channel, Reference Solution 

    S5020A FD-MIMO Multi-Channel, Reference Solution

    • Improve your efficiency, confidence and time to market
    • Validate your base-station FD-MIMO parametric performance & beam-steering
    • Scale to 64 and more channels, at up to 40 GHz

  • S8890A Wireless Device Functional Test Reference Solution S8890A Wireless Device Functional Test Reference Solution 

    S8890A Wireless Device Functional Test Reference Solution

    • LTE TDD, LTE FDD, LTE NB-IoT, W-CDMA, GSM signaling

    • Data Performance/Throughput

    • VoLTE IMS/SIP

    • Battery Drain

  • TS-8989 Automotive Body and Safety Test Reference Solution TS-8989 Automotive Body and Safety Test Reference Solution 

    TS-8989 Automotive Body and Safety Test Reference Solution

    • Automotive electronics Body and Electronics reference solution

  • Y1299A Стартовый комплект для модульных решений в формате PXI Y1299A Стартовый комплект для модульных решений в формате PXI 

    Y1299A Стартовый комплект для модульных решений в формате PXI

    Специализированный стартовый комплект для модульных решений в формате PXI, включающий инструкции по работе с конкретным приложением и примеры программ.