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N5245A PNA-X Microwave Network Analyzer

Product Status: Currently Orderable | Currently Supported

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Current Firmware/Software

Version: n/a
Release Date: 2014-09-01

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High Power Amplifier Measurements Using Keysight's Nonlinear Vector Network Analyzers AN 1408-19
This application note discusses the unique challenges involved in testing high-power devices using Keysight's N5242A nonlinear vector network analyzer(NVNA).

Application Note 2010-01-26

Scalar Network Analyzer, Migrating from Scalar to Vector Network Analyzer Systems, Selection Guide
This selection guide provides information to help you migrate from scalar analyzers to vector network analyzer systems.

Selection Guide 2009-10-29

PDF PDF 1.95 MB
X-Parameters: Commercial Implementations for the Latest Technology Enable Mainstream Applications
This article reprint from Microwave Journal introduces advances in commercially available solutions for characterization, modeling, and design of nonlinear components and systems based on X-parameters

Article 2009-10-09

PDF PDF 1.92 GB
Video Demos on Generating X-Parameters from Circuit Level Designs
This four part series of demonstration videos shows how to generate X-parameters from circuits.

Demo 2009-09-28

PNA-X Press Releases

Press Materials 2009-09-09

Microwaves and RF Cover Article: Nonlinear VNAs Extend to 50 GHz

Article 2009-07-23

Agilent Technologies Expands World's Most Flexible PNA-X Network Analyzer for Active Device Test

Press Materials 2009-06-01

Setting a New Standard for Flexible Network Analyzers

Press Materials 2009-06-01

Understanding Nonlinear Vector Network Analysis

Press Materials 2009-04-15

Agilent Technologies Wins More Than 20 Annual Product Awards for Electronic Design, Measurement

Press Materials 2009-02-24

Agilent Demonstrates Unrivalled Range of Measurement Solutions at Electronica 2008

Press Materials 2008-11-11

Making Fast and Accurate Antenna Measurements

Press Materials 2008-10-27

Industry's Fastest Antenna Test Receiver -- 30 Percent Faster than Existing Solutions

Press Materials 2008-10-27

Agilent’s New Solutions for Microwave, RF, Wireless & Radar at 2008 European Microwave Conference

Press Materials 2008-10-26

Agilent’s PNA-X Achieves 100 Times Faster Swept-IMD Measurements with a Simple, Integrated Setup

Press Materials 2008-10-07

Total Analysis Environment for Modeling
Keysight IC-CAP is flexible and high-performance software that is capable of accurate device characterization, analysis, and easy measurement, and these capabilities take on importance for today's semiconductor modeling.

Application Note 2008-08-21

Agilent Introduces Breakthrough Technology to Analyze Nonlinear Behaviors of Active Components

Press Materials 2008-06-02

Agilent Technologies' New Gain Compression Application Optimizes Accuracy, Speed of Amplifier Test

Press Materials 2007-12-10

Gain Compression Application for Amplifier Test
Amplifier designers and manufacturers characterize the compression level of amplifiers so the performance of RF chains or RF subsystems can be determined and optimized.

Technical Overview 2007-11-10

Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note

Application Note 2007-10-09

Measuring Group Delay of Frequency Converters with Embedded LO

Application Note 2007-09-26

Agilent’s Embedded Local Oscillator Measurement Capability Sets New Standard

Press Materials 2007-09-10

Agilent Technologies' New Source-Corrected Noise-Figure Measurement Option

Press Materials 2007-09-03

Going Beyond S-parameters with an Advanced Architecture for Vector Network Analysis

Article 2007-07-26

PDF PDF 624 KB
Agilent Technologies Displays Leading Line-up of Design, Test Products at 2007 IEEE MTT-S Conference

Press Materials 2007-06-04

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