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B1500A Semiconductor Device Parameter Analyzer (Characterization System) Mainframe/EasyEXPERT

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Protect Your Device Against Power-Related Damage During Test Webcast
Original broadcast August 20, 2014

Webcast - recorded

Surviving State Disruptions Caused by Test: the "Lobotomy Problem”
Boundary scan test may affect the logic states of a device as it switches between core logic operation to test mode operation. This webcast puts forth proposals to restore the logic state to a defined state after testing.

Training Materials 2010-12-21

Switching Solution Webcast
Original broadcast December 16, 2013

Webcast - recorded

Tips, Techniques, and Examples on Using your System Power Supply to Improve Test Throughput Webcast
Live broadcast April 30, 2014; 10am PT / 1pm ET

Webcast

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