Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

Technical Support

B1500A Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe

Product Status: Currently Orderable | Currently Supported

View Product Details

Current Firmware/Software

Version: 6.1.1716.5160
Release Date: 2017-05-29

1-6 of 6

Sort:
Using WaferPro Express with B2200A Switch Matrix
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

Seminar Materials 2016-12-21

PDF PDF 2.35 MB
Advanced Material and Device Parametric Characterization Workshop
Various dates and locations

Seminar

Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs)
Original broadcast Feb 2, 2012

Webcast - recorded

Setting Up IC-CAP WaferPro For On-Wafer Measurements
Original broadcast June 22, 2011

Webcast - recorded

Small signal, low level, DC Parametric measurements: Back to Basics Part 1
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

Webcast - recorded

Semiconductor Parametric Test: Back to Basics Part 2
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded