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E6567F cdma2000/1xEV-DO/LTE/LTE-A Wireless Test Manager

Technical Overviews

Reduce wireless devices test cost for manufacturing and accelerate production by using powerful, easy-to-use test automation software 

Tests Supported

LTE/LTE-A transmitter tests

– Minimum output power

– Maximum output power

– Aggregate power control tolerance

– EVM equalizer spectrum flatness

– Occupied bandwidth

– Additional maximum power reduction

– Configured UE transmitted output power

– Spectrum emission mask

– Additional spectrum emission mask

– PRACH time mask

– SRS time mask

– Power control absolute power tolerance

– PUSCH-EVM with exclusion period

– In-band emissions for non-allocated RB

– Maximum power reduction

– Frequency error

– Error vector magnitude

– Carrier leakage

– Adjacent channel leakage power ratio

– General ON/OFF time mask

LTE/LTE-A receiver tests

– Reference sensitivity level

– Maximum input level

– Adjacent channel selectivity (ACS)

– In-band blocking

– Reference sensitivity level for CA

– Maximum input level for CA

– LTE tiered Rx sensitivity search

– LTE tiered Rx sensitivity search at UE

CDMA call processing

– MEID supported (Yes/No)

– Public long code mask type (ESN based,

– BS assigned, MEID based)

– Registration

– Page (base station origination)

– MS (mobile station) origination

– Base station release

– Voice quality analog quick audio

– Functionality

– Talk time

– IMT-2000, Japan CDMA, NMT-450,

– Korean PCS, US PCS, AWS, US cellular, Upper 700 MHz, 400 MHz European PAMR, and 800 MHz PAMR bands

– Hard handoff (system, band, channel, and PN offset)

– CDMA AMPS interband handoff

CDMA transmitter tests

– Waveform quality

– Code domain power

– Traffic channel open loop power control

– Closed loop power control

– Time response of open loop power control

– Maximum RF output power

– Minimum controlled output power

– Access probe open loop power

– Gated power

– Code channel timing and phase error

– Transmitter spurious emissions

– Handoff waveform quality

– Code channel power accuracy

– Spurious emission

CDMA receiver tests

– Traffic channel FER with AWGN

– Supplemental channel FER with AWGN

– Receiver sensitivity FER

– Receiver sensitivity level search

CDMA Rx/Tx tests

– Quick general test

AMPS transmitter tests

– Frequency error

– RF power output

– Audio frequency response

– Audio distortion

– FM hum and noise

– SAT deviation and frequency error

– Compressor response

– Analog DTMF

– Analog signaling tone

AMPS receiver tests

– SINAD

– Audio frequency response

– Audio distortion

– Hum and noise

– Expandor response

1xEV-DO calling processing

(Applies to Release 0, A, and B)

– Open/end session

– Open data connection

– IMT-2000, Japan CDMA, NMT 450, Korean PCS, US PCS, AWS, US cellular, Upper 700 MHz, 400 MHz European PAMR, and 800 MHz PAMR bands

– Handoff (interband and channel)

– CDMA AMPS interband handoff

1xEV-DO transmitter test

(Applies to Release 0, A, and B)

– Waveform quality

– Code domain accuracy

– Transmitter spurious emissions

– Data, RRI, DRC, and ACK channel output power

– Maximum output power

– Access probe open loop power

– Minimum controlled output power

– Closed loop power control

– Time response for open loop power control

1xEV-DO receiver tests

(Applies to Release 0, A, and B)

– Traffic channel PER with AWGN

– Receiver sensitivity and dynamic range

General tests

– Current drain

– Start loop

– End loop

– Send/Receive GPIB command

– Data analyzer

– Send/Receive DUT command

– Keysight 14565B device characterization software control

Hardware Supported

Test instruments

– E7515A UXM wireless communications test set

– E7530A LTE test application and E7630A LTE lab application

– Keysight 8960 Series 10 wireless communications test set

– E5515E or E5515C mainframe (or equivalent E5515B/T) with Option 003

– E1962B cdma2000®/IS-95/AMPS mobile test application (revision B.15.18 or later)

– E1966A 1xEV-DO test application (revision A.10.18 or later)

– E1987A GSM/GPRS/EGPRS, AMPS/136, cdma2000, 1xEV-DO, W-CDMA fast switching mobile test application (revision A.09.21 or later)

– Keysight 66311B, 66319B, and 66321B power supplies

– Keysight 34970A with 34901A, 34903A, and 34907A data acquisition/switch unit

Adapters

– Keysight 82357A USB/GPIB interface

– National Instruments GPIB-USB-A external controller

PC cards

– Keysight GPIB

– National Instruments GPIB

– Advantech PCI 1750 E6567F-1TP

– Control RocketPort 95870-3 and 99096-3 multi-port

serial card

Peripherals

– Symbol LS-1220-1200A fixed bar code reader

– Symbol LS-3603MX-1200A, P300FZY, and LS40041-I100 handheld bar code reader

– HP printers

– Epson TM-U200D and TM-U200D strip printer

PC requirements

– Operating system: Microsoft Windows 7 Professional and Enterprise

– Microsoft Visual Studio.NET

– Microsoft Internet Explorer Version 6.0 or later

– 600 MHz Pentium III or higher (1 GHz Pentium III or higher for extended capability)

– 512 MB RAM minimum (1024 MB is recommended for normal development and is required for extended capability operation)

– 200 MB free hard drive space

– CD-ROM

– GPIB card or converter with VISA drives (one per test system)

– LAN port for remote control of UXM

– Serial ports for fixtures, device control, and bar code reader

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