Technical Overviews
Reduce wireless devices test cost for manufacturing and accelerate production by using powerful, easy-to-use test automation software
Tests Supported
LTE/LTE-A transmitter tests
– Minimum output power
– Maximum output power
– Aggregate power control tolerance
– EVM equalizer spectrum flatness
– Occupied bandwidth
– Additional maximum power reduction
– Configured UE transmitted output power
– Spectrum emission mask
– Additional spectrum emission mask
– PRACH time mask
– SRS time mask
– Power control absolute power tolerance
– PUSCH-EVM with exclusion period
– In-band emissions for non-allocated RB
– Maximum power reduction
– Frequency error
– Error vector magnitude
– Carrier leakage
– Adjacent channel leakage power ratio
– General ON/OFF time mask
LTE/LTE-A receiver tests
– Reference sensitivity level
– Maximum input level
– Adjacent channel selectivity (ACS)
– In-band blocking
– Reference sensitivity level for CA
– Maximum input level for CA
– LTE tiered Rx sensitivity search
– LTE tiered Rx sensitivity search at UE
CDMA call processing
– MEID supported (Yes/No)
– Public long code mask type (ESN based,
– BS assigned, MEID based)
– Registration
– Page (base station origination)
– MS (mobile station) origination
– Base station release
– Voice quality analog quick audio
– Functionality
– Talk time
– IMT-2000, Japan CDMA, NMT-450,
– Korean PCS, US PCS, AWS, US cellular, Upper 700 MHz, 400 MHz European PAMR, and 800 MHz PAMR bands
– Hard handoff (system, band, channel, and PN offset)
– CDMA AMPS interband handoff
CDMA transmitter tests
– Waveform quality
– Code domain power
– Traffic channel open loop power control
– Closed loop power control
– Time response of open loop power control
– Maximum RF output power
– Minimum controlled output power
– Access probe open loop power
– Gated power
– Code channel timing and phase error
– Transmitter spurious emissions
– Handoff waveform quality
– Code channel power accuracy
– Spurious emission
CDMA receiver tests
– Traffic channel FER with AWGN
– Supplemental channel FER with AWGN
– Receiver sensitivity FER
– Receiver sensitivity level search
CDMA Rx/Tx tests
– Quick general test
AMPS transmitter tests
– Frequency error
– RF power output
– Audio frequency response
– Audio distortion
– FM hum and noise
– SAT deviation and frequency error
– Compressor response
– Analog DTMF
– Analog signaling tone
AMPS receiver tests
– SINAD
– Audio frequency response
– Audio distortion
– Hum and noise
– Expandor response
1xEV-DO calling processing
(Applies to Release 0, A, and B)
– Open/end session
– Open data connection
– IMT-2000, Japan CDMA, NMT 450, Korean PCS, US PCS, AWS, US cellular, Upper 700 MHz, 400 MHz European PAMR, and 800 MHz PAMR bands
– Handoff (interband and channel)
– CDMA AMPS interband handoff
1xEV-DO transmitter test
(Applies to Release 0, A, and B)
– Waveform quality
– Code domain accuracy
– Transmitter spurious emissions
– Data, RRI, DRC, and ACK channel output power
– Maximum output power
– Access probe open loop power
– Minimum controlled output power
– Closed loop power control
– Time response for open loop power control
1xEV-DO receiver tests
(Applies to Release 0, A, and B)
– Traffic channel PER with AWGN
– Receiver sensitivity and dynamic range
General tests
– Current drain
– Start loop
– End loop
– Send/Receive GPIB command
– Data analyzer
– Send/Receive DUT command
– Keysight 14565B device characterization software control
Hardware Supported
Test instruments
– E7515A UXM wireless communications test set
– E7530A LTE test application and E7630A LTE lab application
– Keysight 8960 Series 10 wireless communications test set
– E5515E or E5515C mainframe (or equivalent E5515B/T) with Option 003
– E1962B cdma2000®/IS-95/AMPS mobile test application (revision B.15.18 or later)
– E1966A 1xEV-DO test application (revision A.10.18 or later)
– E1987A GSM/GPRS/EGPRS, AMPS/136, cdma2000, 1xEV-DO, W-CDMA fast switching mobile test application (revision A.09.21 or later)
– Keysight 66311B, 66319B, and 66321B power supplies
– Keysight 34970A with 34901A, 34903A, and 34907A data acquisition/switch unit
Adapters
– Keysight 82357A USB/GPIB interface
– National Instruments GPIB-USB-A external controller
PC cards
– Keysight GPIB
– National Instruments GPIB
– Advantech PCI 1750 E6567F-1TP
– Control RocketPort 95870-3 and 99096-3 multi-port
serial card
Peripherals
– Symbol LS-1220-1200A fixed bar code reader
– Symbol LS-3603MX-1200A, P300FZY, and LS40041-I100 handheld bar code reader
– HP printers
– Epson TM-U200D and TM-U200D strip printer
PC requirements
– Operating system: Microsoft Windows 7 Professional and Enterprise
– Microsoft Visual Studio.NET
– Microsoft Internet Explorer Version 6.0 or later
– 600 MHz Pentium III or higher (1 GHz Pentium III or higher for extended capability)
– 512 MB RAM minimum (1024 MB is recommended for normal development and is required for extended capability operation)
– 200 MB free hard drive space
– CD-ROM
– GPIB card or converter with VISA drives (one per test system)
– LAN port for remote control of UXM
– Serial ports for fixtures, device control, and bar code reader
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