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Migrating from a 4279A 1 MHz C-V Meter to a E4980A Precision LCR Meter

Technical Overviews

Matching the excellence of the 4279A in semiconductor C-V test

Top 3 reasons to migrate

– Excellent cost/performance value

– More versatile

– Easy to use

Keysight Technologies, Inc. is proud to introduce the Keysight E4980A precision LCR meter to our 4279A customers. Based on the latest technology, this LCR meters provides the best combination of accuracy, speed and versatility for a wide range of component measurements. The E4980A offers excellent cost/performance value, enhancing your test and measurement efficiency by providing fast measurement speed and outstanding performance over a wide frequency range. The Keysight 4279A, specially designed for DC bias C-V measurements with an optimized internal circuit set at 1 MHz, provides excellent measurement speed for C-V testing. The Keysight E4980A LCR meter matches the outstanding measurement capability of 4279A at 1 MHz for C-V testing and improves testing versatility by providing measurement capability at multiple frequencies (20Hz to 2MHz).

Advantages of the E4980A LCR Meter

The Keysight E4980A LCR meter1 offers the same excellent performance and measurement capability you've come to expect from the 4279A CV meter and adds increased measurement flexibility. The E4980A matches 4279A's basic accuracy (0.1% for SHORT) and outstanding speed at 1 MHz, and increases the measurement frequency range (20 Hz to 2 MHz). Standard functions such as: Auto bias polarity control for the quick selection of the correct polarity of devices under test, and a DC bias voltage list sweep source to assure very low measurement error due to bias voltage uncertainty, are still available. The E4980A also provides new functions such as: a variable test signal level for evaluating AC voltage characteristics and 201 point list sweep which lets you set frequency, measurement range and stimulus conditions as list parameters. Easy PC and auto-test system connectivity and a user-friendly interface further improve productivity.

The E4980A matches the outstanding measurement speed of 4279A

The following graphs and tables show the measurement accuracy, measured data fluctuation, and measurement speed comparison between the E4980A and the 4279A. These graphs are based on results of 100 continuous tests.

In conclusion, the E4980A has a faster measurement speed in SHORT mode with the same level of data fluctuation as the 4279A. In MED mode, the E4980A has better accuracy and less data fluctuation than the 4279A in either MED or LONG mode. However, the measurement speed of E4980A MED mode is quite a bit slower than the measurement speed of the 4279A in MED or LONG mode. In order to maintain fast measurement speed and high test throughput, Keysight advises the use of SHORT mode with the average times shown below. 4279A SHORT mode: E4980A SHORT mode with average time 1

4279A MED mode: E4980A SHORT mode with average time 5

4279A LONG mode: E4980A SHORT mode with average time 11

GPIB data transfer speed comparison

The E4980A's GPIB data transfer speed is 3-10 times faster than the data transfer speed of the 4279A.

More versatile

The E4980A provides powerful features to increase test reliability and efficiency. The instrument has a new user interface that is easier to use and measurement capabilities to suit your applications. 

User friendly interface offers more PC connectivity 

Flexible connectivity: Use USB (USB-TMC), LAN and GPIB interfaces to control the E4980A. You can even use a LAN cable with a computer and a Web browser. USB memory interface: A USB memory device can be used to save setup states, measurement log data and graphic image files.

Advanced Easy-to-Use Interface

– New “skip” key let you access lower-level menus quickly and easily

– Larger windows improve readability

– “Quick recall” key shortens recall time

– New [Preset] key enables fast, easy clearing and resetting of test setups

Enhanced setup flexibility

The E4980A provides more accurate evaluation under actual usage situations. This is due to:

– Enhanced resolution of test signal voltage and DC bias voltage (max.).

– Test signal: Min. 100 uV (Only six fixed points for 4279A, such as 20 mV,

– 50 mV, 100 mV, 1000 mV.)

– Bias voltage: Min. 330 uV (1 mV for the 4279A)

– Enhanced data display: 7 digit resolution for the E4980A (6 digit resolution for the 4279A),

– Delay time resolution: Min 100 us (1 ms for the 4279A) for step delay. Min 100 us (N/A for the 4279A) for trigger delay.

With the E4980A LCR, you can set frequency, measurement range and stimulus conditions as list parameters (up to 201). Set two parameters independently to achieve measurement results under a variety of conditions. With an external PC and a data spreadsheet application such as Microsoft Excel, you can simplify character analysis of impedance vs frequency (test signal, DC bias, etc.). The Keysight 4279A has been the industry standard in semiconductor C-V test for approximately 20 years. Its replacement, the E4980A LCR meter, provides same high speed and accuracy you’ve come to expect from the 4279A with increased measurement flexibility, PC connectivity and auto-test system connectivity helping to improve the overall cost/performance value. 

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