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Automated Measurement Expert

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Keysight Technologies

Automated Measurement Expert

  • S94701A Test Plan Builder
  • S94702A VNA Plugin
  • KS8400A Test Automation Platform

The Evolution of Multiport VNA Automation

The Keysight Automated Measurement Expert (AMX) is a smart software solution for automated multiport S-parameter measurements with the PXIe and benchtop vector network analyzers. Inheriting the proven frontend/backend structure from the conventional Measurement Wizard Assistant software, AMX provides an easy and efficient test solution for multiport RF components such as RF frontend modules (FEMs), antenna switch modules, and multiport interconnects. In addition, AMX has evolved to offer higher throughput with multisite parallel testing using the PXIe VNAs.

Easy, Fast and Flexible

AMX consists of the following software items:

  • Keysight S94701A Automated Measurement Expert, Test Plan Builder
  • Keysight S94702A Automated Measurement Expert, VNA Plugin
  • Keysight KS8400A Test Automation Platform (TAP), Developer’s System

The AMX frontend Test Plan Builder automatically generates TAP test plan files that contain optimal VNA setups and test sequences from your DUT test plans. The AMX backend software consists of the TAP and VNA Plugin and performs automated multiport S-parameter tests according to the generated TAP plan files. This enables you to conduct complicated tests of multiport RF components easily by just editing your DUT test plans with the Test Plan Builder. There is no need to do any programming for the core VNA setup and measurement sequences. The AMX backend software is remote controllable from an external control program through the TAP’s API, and you can build a fully automated test system in combination with a handler or a wafer prober. In the PXIe VNA based AMX system, you can perform multisite parallel measurements by running multiple VNA and TAP instances from the external control program.

AMX Frontend: Test Plan Builder

The AMX frontend Test Plan Builder enables you to edit your DUT test plans and generate the corresponding TAP plan files for the AMX backend software. Its wizard GUI allows you to intuitively enter the test conditions such as the DUT information, cable connections, VNA’s sweep settings, and test limit values. In addition, you can define topologies of external test sets or RF switches which expand the number of VNA test ports. Enter all the required information and the Test Plan Builder outputs optimal DUT test sequences as TAP plan files. You can use the Test Plan Builder by installing the AMX software to your PC or controller, and activating its Test Plan Builder capability with the S94701A license. Typically the Test Plan Builder is used on the PC where you edit your test plans, outside the VNA test system. In a PXIe VNA based systems, you can use the Test Plan Builder on the PXIe controller together with the TAP and VNA Plugin.

Combination with Excel

To efficiently edit a large test plan of a RF FEM which has a lot of operating modes, the Test Plan Builder allows you to edit the test plan in combination with Microsoft Excel. This enables you to see the entire picture across the modes in an Excel table. Once you’ve edited your test plan in the Excel template, you can import it into the Test Plan Builder to build and output the test sequence as a TAP plan file.

AMX Backend: Test Automation Platform & VNA Plugin

The combination of the TAP and the VNA Plugin forms the AMX backend software which makes the VNA setups and executes the test sequences in the PXIe controller, according to the TAP plan files generated by the Test Plan Builder. The KS8400A Test Automation Platform is the base software which acts as the test sequencer. And the S94702A VNA Plugin adds the VNA measurement capability to the TAP. The AMX backend software performs the multiport S-parameter measurements and the pass/fail tests for your DUT test plans. In addition, it supports other useful functions, including the Cal Wizard for performing the calibration using the 4-port ECal module, and the data logging function with the CSV and Touchstone SnP formats. You can use the backend software by installing the TAP and AMX software to your PXIe controller or benchtop VNA and activating the TAP and AMX VNA Plugin capabilities with the KS8400A and S94702A licenses.

Expanding the Number of Test Ports with Switches

Using an external test set or RF switches is a cost-effective solution for expanding the number of VNA test ports. AMX comprehensively supports this need with the frontend Test Plan Builder and the backend plugins for the M9161D PXI solid state dual SP4T switch modules and E5092A configurable multiport test set. The switch configurations and connection patterns can be defined in the topology and connections settings of the Test Plan Builder. The switch control during the execution of the Cal Wizard and DUT test sequence is performed by these AMX plugins.

Controlling DUT Mode

When testing RF FEMs for mobile handsets, the DUT mode must be switched using the RFFE or parallel control signals. For the PXIe VNA based system, the AMX M9341B plugin enables the M9341B PXIe I/O module to output the RFFE and parallel control signals from its 8-bit I/O port, as well as the DC voltages from its analog output ports. For both benchtop and PXIe VNA based systems, the AMX E5092A plugin enables the E5092A multiport test set to output the parallel control signals from its control lines, along with controlling its internal RF switches. The sequence of these DUT mode control signals is defined in the Test Plan Builder. Unlike the conventional MWA software, AMX can aggregate the measurements of multiple modes into the same VNA channel if the modes are to be measured with the same test ports, calibration, and stimulus setting. The measurements of those modes are executed by repeating the sweeps in one channel while switching test limit values for each mode. For example, an RF switch block or a variable-gain LNA block in the RF FEM can be tested with one VNA channel by changing their switch state or gain setting. This capability allows you to test RF FEMs with more modes within the limited VNA channel resource.

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