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Application Notes
Atomic force microscopy (AFM), with its sub-nanometer high spatial resolution has emerged as an increasingly important instrumentation for wide, diversified applications in both academia and industry in recent years. Since its first development in 1986, AFM has undergone many advancements, not only to extend its measurement capabilities, but also to make the instrument more robust and user-friendly. Despite these efforts, the slow image acquisition speed of AFM still remains a challenge to date. Typically, depending upon samples and imaging conditions including scan size and resolution, it can take up to several minutes to scan an AFM image, thereby limiting the AFM’s throughput and its applicability to capture in situ dynamical processes. Therefore, the QuickScan technology developed by Keysight Technologies, Inc. addresses this issue through its ultrafast scanning capability of more than 100 lines/s or up to 2 s/frame (200 × 200 pixels) without sacrificing the high image quality. Other AFM measurement capabilities, such as but not limited to electrical characterization are also not compromised by the ultrafast acquisition speed. In this application note, examples showing the application of the QuickScan technology for capturing in situ dynamical processes are demonstrated using the Keysight 9500 AFM. Kelvin force microscopy (KFM) measurement using QuickScan is also illustrated here.
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