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5500 AFM Controller Upgrade

Data Sheets

Keysight Technologies

5500 AFM Controller Upgrade

Data Sheet 

Upgrade Overview

The Keysight 5500 AFM Controller Upgrade offers a tremendously convenient and cost-effective pathway to a more versatile, easier-to-use AFM. Upgrading your 5500 for use with a high-bandwidth digital controller and new NanoNavigator software greatly simplifies the complete control of all scanning parameters while providing the flexibility needed to conduct more complex experiments associated with materials science, life science, polymer science, and electrical characterization. For electrochemistry applications, NanoNavigator provides precise control of potentials and cyclic voltammetry. And to facilitate the investigation of surface reactivity and interfacial processes, the software supports Keysight’s powerful AFM-SECM (scanning electrochemical microscopy) technique. Furthermore, NanoNavigator enables easy-to use Quick Sense, a new imaging mode from Keysight that permits quantitative mapping of nanomechanical properties. It now supports Scanning Microwave Microscopy Mode and TREC. Just trade in your present controller and head electronics box and we will send you the revolutionary NanoNavigator software package, a new digital controller, a new head electronics box, a new computer, a new monitor, new cables, and an installation guide. The self-install process is quick and easy, so you can start using your upgraded 5500 AFM right away. You can also arrange for a remote support session if you would like one. 

New NanoNavigator Software

Even true AFM novices in your lab will find it easy to operate the upgraded 5500 system thanks to Keysight NanoNavigator. After loading a cantilever, the user simply enters the cantilever type into the software and the Auto Drive feature does the rest, automatically and optimally setting parameters within a matter of seconds. If a particular experiment requires the use of non-default settings, NanoNavigator is still exceptionally helpful. AFM beginners and experts alike will appreciate the new software’s workflow-based GUI as it guides users step-by-step through system setup and operation via intuitive and attractive visuals. For ultimate convenience, the NanoNavigator mobile app for smartphones and tablets allows remote monitoring of AFM experiments while they are being performed by the 5500. Upgrading with NanoNavigator and a digital controller immediately gives your 5500 system the ability to utilize all the popular imaging modes, including contact mode, acoustic AC (AAC) mode, lateral force mode (LFM), MAC mode, STM, current-sensing AFM (CS-AFM), electric force microscopy (EFM), Kelvin force microscopy (KFM), and magnetic force microscopy (MFM). Your 5500’s scan rates will also improve. NanoNavigator also supports volume spectroscopy and FlexGrid spectroscopy, as well as math plug-ins to facilitate quantitative analysis. Additional and extensive interactive post-processing capabilities are provided by Keysight’s easy-to-use Pico Image, an imaging and analysis software package built into NanoNavigator. Pico Image provides all of the features and functions required to build a surface analysis report on multilayer measurement data.

Quick Sense

NanoNavigator software enables Quick Sense, a new Keysight imaging mode that permits quantitative mapping of nanomechanical properties on a wide range of samples. Via NanoNavigator’s simple GUI, Quick Sense lets you quickly and easily set modulation amplitudes and frequencies, acquire individual force-distance curves, and measure adhesion, stiffness and elasticity. All of the data is collected while the 5500 AFM simultaneously images the sample’s topography, resulting in both precise and accurate characterization of local mechanical property variations at the nanoscale.

Scanning Microwave Microscopy

Scanning microwave microscopy (SMM) mode combines the exceptional electrical measurement capabilities of a vector network analyzer (VNA) with the outstanding spatial resolution of an atomic force microscope (AFM). This unique mode outperforms traditional AFM-based scanning capacitance microscopy techniques, offering far greater application versatility, the ability to acquire calibrated quantitative results, and the highest sensitivity and dynamic range in the industry. In SMM mode, a VNA sends an incident microwave signal through a diplexer to the sub-7-nm conductive tip of a platinum-iridium cantilever. The signal is reflected from the tip and measured by the VNA. The magnitude and phase of the ratio between the incident and reflected signals are calculated and a model is then applied in order to calculate the electrical properties of the sample. The AFM scans the sample and moves the tip to specific locations to perform point probing. Operation frequencies up to 20 GHz are supported. SMM mode offers unprecedented utility for a diverse set of applications. SMM mode’s ability to provide calibrated, high-sensitivity, compound electrical and spatial measurements is particularly useful for semiconductor test and characterization. In addition to enabling complex impedance (resistance and reactance) measurements, SMM can be used to acquire calibrated capacitance and dopant density measurements when studying sidewall diffusion. SMM mode works on all semiconductors: Si, Ge, III-V (e.g., GaAs, InAs, GaN), and II-VI (e.g., CdTe, ZnSe). Unlike scanning-probe capacitive techniques, SMM mode does not require an oxide layer.

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