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Application Notes
Polymers have been widely used in most fields of science and industry for various purposes due to their unique properties. Implementing polymer materials with different structures and functions (i.e., block copolymers, bulk polymers, thin-film polymers, polymer composites and polymer blends) requires profound understanding of how structures, properties, processing and performance are related. The surface information provided with micro- and nano-scale resolution facilitates better understanding of these effects, as well as creating multifunctional polymers for new applications.
The atomic force microscope (AFM) is one of the most essential tools for surface characterization of polymer materials, alongside optical microscopy and electron microscopy (i.e., scanning electron microscopy and transmission electron microscopy). Comparatively, AFM provides specific advantages over other microscopies in several ways and has been extensively used to provide nanoscale information on various physical properties and performances in addition to morphological imaging of polymer materials.
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