Brochures
Automated Variable Temperature Measurement
Keysight Technologies and Lake Shore Cryotronics
Conveniently measure materials and devices over a wide temperature range
Temperature-dependent characterization of new devices and materials can yield important understanding about defects and basic conductivity mechanisms. At very low temperatures, thermally-activated carriers are essentially immobilized, allowing the inherent electronic transport properties of the material to be revealed.
Repeating complex measurements while changing temperature settings can result in extended test times. Now a new solution from Keysight Technologies and Lake Shore Cryotronics allows the precise characterization of early-stage materials and devices over wide temperature ranges to be made quicker and more conveniently.
A new interface to Lake Shore probe stations’ cryogenic temperature controller (Model 336) enables researchers using the powerful Keysight B1500A Semiconductor Device Parameter Analyzer and the EasyEXPERT software (included with the B1500A) to manage temperature settings programmatically while making automated measurements.
With the B1500A analyzer on a Lake Shore cryogenic probe station, you can efficiently probe early-stage devices and materials. Then you can initiate the software to run a diverse set of parameter measurements over a range of temperatures, while unattended.
EasyEXPERT takes care of the measurements, whether for CV, IV, or pulsed IV characterization, and co-ordinates seamlessly with the Model 336 to precisely record and control sample temperatures throughout the run.
The new integrated variable temperature measurement solution from Keysight and Lake Shore provides convenient operation, with greater productivity and more reliable measurements.
Automated Variable Temperature Measurements
Continuously Variable Temperature Probes
Continuous probed measurements over wide temperature ranges are enabled by Lake Shore’s patented Model ZN50R-CVT probes, included with every station. These special probes flex to accommodate thermal expansion, maintaining contact integrity. There is no need to lift and reposition probes as sample temperatures change.
In addition, special thermal anchoring on the Lake Shore ZN50R-CVT probes and probe arms controls unwanted heat sources, resulting in more accurate sample temperatures and more reliable measurements.
×
Please have a salesperson contact me.
*Indicates required field
Thank you.
A sales representative will contact you soon.