Column Control DTX

Simultaneous Measurements Using Keysight BenchVue Software

Application Notes

When you want to capture state changes in a device under test (DUT), you need to simultaneously measure different signals as fast as possible. This presents several problems:

– How do you determine the sample rate of all the instruments?

– How do you achieve precise sample timing?

– How do you get the results into readable form?

BenchVue software from Keysight Technologies, Inc. provides a way to address these problems enabling you to be productive quickly without having to write a computer program.

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Column Control DTX