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The dual-Dirac model is a tool for quickly estimating total jitter defined at a low bit error ratio, TJ(BER). The deterministic and random subcomponents of the jitter signal are separated within the context of the model to yield two quantities, root-mean-square random jitter (RJ) and a model-dependent form of the peak-to-peak deterministic jitter, DJ(δδ). The total jitter of a system is then estimated from RJ and DJ(δδ).
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment. The Q-scale formulation is described in detail and is used to provide a simple visual description of the model’s features and to show how different implementations of the model can lead to different results. For an introduction to jitter analysis please see reference.
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