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M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers

Technical Overviews

Keysight Technologies

M9068A Phase Noise

X-Series Measurement Application for PXI Vector Signal Analyzers

Technical Overview

  • One-button, easy-to-use, fast phase noise measurements with log plot and spot frequency views
  • Spectrum and IQ waveform monitoring for quick signal checks in frequency or time domain
  • Supports the M9391A and M9393A PXIe Vector Signal Analyzers
  • Softkey manual user interface or SCPI remote user interface
  • Built-in, context-sensitive help
  • Transportable license supports up to four PXI VSA channels in one mainframe

Phase Noise Measurement Application for Modular Instruments

Expand the capabilities of your M9391A and M9393A PXIe vector signal analyzers (PXI VSAs) with Keysight Technologies’ library of measurement applications - the same applications used to increase the capability and functionality of its X-Series signal analyzers. Twelve of the most popular applications are now available for use with Keysight’s new M9393A PXIe performance VSA and the M9391A PXI VSA. When you combine the raw hardware speeds of the PXI VSAs and the X-Series measurement applications for modular instruments, you can test more products in less time, while ensuring measurement continuity from design to manufacturing. The phase noise measurement application is an ideal tool for design verification and troubleshooting as well as production line testing. This application is built upon Keysight’s best-selling Option 226 phase noise measurement personality used in ESA and PSA spectrum analyzers and includes enhancements in measurement algorithms for optimized speed and dynamic range.

Proven algorithms and a common user interface across the X-Series analyzers and modular PXI VSAs create a consistent measurement framework for signal analysis that ensures repeatable results and measurement integrity so you can leverage your test system software through all phases of product development. The phase noise measurement application is one in a common library of several measurement applications. You can further extend your test assets by utilizing up to four PXI VSAs with one software license.

Keysight’s X-Series applications for modular instruments also include a unique “Resource Manager” that provides direct access to PXI VSA hardware drivers for the fastest power and spectrum-based measurements, while simultaneously using the X-Series applications for fast phase noise measurements and the 89600 VSA software for fast spectrum measurements.

Phase Noise Measurement Application for Modular Instruments

As wireless communication technologies evolve in the commercial and aerospace and defense industries, it is clear that the driver to meet demand for higher data rates, better spectrum efficiency, and lower power consumption is the digital technology, such as digital signal processing (DSP). It does not, however, devalue the importance of high-purity, high-stability signals—signal stability is fundamental to successful modern digital wireless communication systems. Phase noise is still one of the most important characteristics when evaluating the short-term stability of a signal. Pressure to bring products to market more quickly than ever does not allow time for executing multiple measurements across several instruments. An accurate, fast, and easy-to-use phase noise measurement tool is critical in the R&D and manufacturing environments.

A variety of measurement techniques have been developed to meet various requirements for phase noise measurements. The three most widely adopted techniques are: direct spectrum, phase detector, and two-channel cross-correlation. Among them, the direct spectrum technique is the simplest and perhaps oldest technique for making phase noise measurements.

Keysight’s X-Series phase noise measurement application is based on the direct spectrum technique. The most obvious advantage using the direct spectrum technique for phase noise measurements is that it can be realized with a general-purpose signal/spectrum analyzer. However, the analyzer’s settings, such as resolution bandwidth (RBW) and internal phase noise optimization loops, will need to be adjusted based on offset frequency to achieve the highest measurement accuracy and speed. Manually implementing phase noise measurements with a signal analyzer can be tedious and time consuming. The X-Series phase noise measurement application automates the optimization processes for the signal analyzer settings with one button measurements without user interference.

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