Brochures
Keysight Technologies
RF PA/FEM Characterization & Test, Reference Solution
Solution Brochure
This Reference Solution provides high throughput, measurement quality, and performance for design validation and production test of next generation power amplifiers/front end modules (PA/FEM) supporting cellular and wireless connectivity formats.
Next generation RF PA/FEM characterization and test challenges
Wireless mobile device manufacturers continue to look for ways to drive down cost while improving performance of their devices. To support this trend, power amplifier duplex (PAD) devices are an increasingly popular alternative to the more traditional PA architecture. These smaller, highly integrated devices allow designers to optimize space by replacing multiple, discrete components with a single, compact module while lowering power consumption and increasing performance.
With device complexity and performance requirements increasing, the amount and type of testing continues to grow while price pressures simultaneously drive the need for higher throughput.
Testing next generation RF PAs brings new challenges:
Using a Reference Solution to address PA/FEM test challenges
RF PA/FEM characterization and test, Reference Solution enables rapid, full characterization of next-generation power amplifier modules such as PAD devices, including S-parameter, demodulation, power, adjacent channel power and harmonic distortion measurements. Digital pre-distortion (DPD) and envelope tracking signal generation and analysis are enabled by Keysight’s N7614B Signal Studio for Power Amplifier Test software. Closed/open loop DPD and envelope tracking measurements can be made in tens of milliseconds with the M9451A PXIe measurement accelerator. The Reference Solution control software enables tight synchronization between the signal source and the arbitrary waveform generator (AWG), resulting in optimal alignment between input signal and envelope.
To facilitate evaluation and integration into your test environment, you can use supplied test code examples that have been designed to optimize test throughput without compromising performance.
Reference Solution Architecture for Design Validation Test
Reference Solution Architecture for Production Test
Hardware - Solution Features & Benefits
Hardware - Key Specifications & Characteristics
Hardware — Instruments
M9381A PXIe Vector Signal Generator
Designed for fast data interfaces and high-speed automated test systems, the M9381A generates RF signals up to 6 GHz with 160 MHz bandwidth. The M9381A is compatible with the full range of Signal Studio communications applications. A typical M9381A configuration includes 4 individual PXIe modules — M9311A digital vector modulator, M9310A source output, M9301A synthesizer and M9300A frequency reference (may be shared with other signal generators and analyzers in the same chassis).
M9391A PXIe Vector Signal Analyzer, 1 MHz to 6 GHz
M9393A PXIe Vector Signal Analyzer, 9 kHz to 8.4/14/18/27 GHz
Designed for fast power and demodulation measurements in high-speed automated test systems, the M9391A and M9393A analyze signals with 160 MHz bandwidth. Perform power measurements quickly with real-time signal processing and analyze harmonic distortion. The M9391A and M9393A are compatible with the full range of X-Series Measurement Applications for signal analysis. A typical M9391A configuration includes 4 individual PXIe modules: M9301A synthesizer, M9214A digitizer, M9350A downconverter and M9300A frequency reference. A typical M9393A configuration includes: 4 individual PXIe modules — M9308A synthesizer, M9214A digitizer, M9365A downconverter and M9300A frequency reference. The M9300A may be shared with other signal generators and analyzers in the same chassis.
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