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Combining AFM with Scanning Electrochemical Microscopy (SECM)

Application Notes

Scanning probe microscopy (SPM) techniques have found a broad range of applications in characterizing the physical and chemical properties of the surface of interested materials. One technique that is particularly useful for studying localized electrochemical activities at the solid/liquid and liquid/liquid interface is Scanning Electrochemical Microscopy (SECM), which was introduced by Bard and coworkers in 1986[1]. Laterally resolved, in situ electrochemical information of surface properties can be obtained by scanning an ultramicroelectrode (UME) at a defined distance across the sample surface. Even though it looks similar to other SPM techniques in the sense that it involves the control of scanning a physical probe across a sample surface, the operation principle for a conventional SECM is quite different. SECM characterizes the localized properties of the electrified solid/liquid and liquid/liquid interfaces by monitoring the electrochemical current. When the electrode is swept across a sample surface, changes in current allow imaging of insulating and conducting surfaces for topology and reactivity information. A detailed introduction of SECM and its applications are found in a separate note.

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