Column Control DTX

Solutions for Transmit/Receive Module Test

Brochures

Keysight Technologies

Solutions for Transmit/Receive Module Test

Technology Trends and Their Impact on Test

Radar, satellite and electronic warfare (EW) systems utilize a wide variety of microwave modules. For example, Active Electronically Steered Arrays (AESA) include thousands, or even tens of thousands, of Transmit/Receive (TR) modules. TR modules typically need extensive testing to ensure that they are matched across the phased array in which they are used. To complicate matters, many modules are smart devices that operate in a variety of modes and require multiple commands from the test platform for each test. In addition, each module is tested at multiple steps in the assembly process and traceability is required from step to step.

Across these applications, a common set of issues tends to occur during testing in the engineering and production environments. The overall cost of test is directly related to three major factors: the labor burden, the equipment cost, and the total test time accumulated across all steps in the process.

The Keysight Technologies, Inc. PNA-X Series microwave network analyzers offers a high performance integrated solution for addressing the most challenging test needs of today’s TR module. This brochure provides an overview of the PNA-X’s unique benefits in meeting the test needs of the next generation of TR modules.

Market Trends

Increasing frequencies, bandwidths, and resolutions

– Architectures support multiple functions

– More bands/shared spectrum/simultaneous operation

More sophisticated algorithms and signals

– Applying “Information Theory” to more applications

– Signals adapt to detected targets and conditions

Solid state enables more applications

– Higher performance (GaAs, GaN, SiC)

– Lower cost (SiGe & even CMOS at mmWave)

– MMIC, SoC, Radar-on-a-chip

Number of array elements increasing

– Element cost, size and power decreasing

– Higher levels of integration

– Must improve test throughput

Calibrating at the array level

– Module volumes drive new approaches to calibration and functional tests

 – More expensive test facilities

The Goal: Meet Increasing Volume Demands with High Quality TR Modules

TR module testing challenges

– Improve accuracy and repeatability over tighter specifications

 The need to meet requirements of high performance TR modules

–Dramatically increase your throughput to meet module volumes

New designs are requiring tens of thousands of modules that need to be tested at both the module and array level.

– Ramp up your capabilities, but with tighter budgets

The need for a simplified test platform that can be used for all test needs

Gain Deeper Confidence

TR modules have a major effect on RF performance. During transmit operations the output RF pulse is amplified by the module, thereby defining the maximum radiated power of the radar. Because the transmitter is operated in pulsed mode, output pulse parameters are typically measured. During receive operations the low-noise amplifier (LNA) within the module input determines the system noise figure and consequently the minimum detectable signal. Within each path, programmable phase shifters and attenuators control the antenna beam-steering and determine the angular accuracy of the radar.

The PNA-X’s industry leading performance provides the measurement integrity you need to ensure accurate and repeatable test results across the wide range of testing required by today’s advanced TR modules. The following highlights the unique measurement capabilities of the PNA-X.

×

Please have a salesperson contact me.

*Indicates required field

Preferred method of communication? *Required Field
Preferred method of communication? Change email?
Preferred method of communication?

By clicking the button, you are providing Keysight with your personal data. See the Keysight Privacy Statement for information on how we use this data.

Thank you.

A sales representative will contact you soon.

Column Control DTX