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Technical Overviews
Keysight
LTE and LTE-Advanced FDD/TDD
X-Series Measurement Application
N9080B and W9080B
N9082B and W9082B
Technical Overview
LTE/LTE-Advanced FDD and TDD Measurement Applications
The LTE/LTE-Advanced FDD and TDD measurement applications transform the X-Series signal analyzers into 3GPP LTE/LTE-Advanced standard-based RF transmitter testers. The applications provide fast, one-button RF conformance measurements to help you design, evaluate, and manufacture your LTE and LTE-Advanced base stations (eNB) and user equipment (UE). The measurement applications closely follow the 3GPP standard, allowing you to stay on the leading edge of your design and manufacturing challenges.
X-Series measurement applications
X-Series measurement applications increase the capability and functionality of Keysight signal analyzers to speed time to insight. They provide essential measurements for specific tasks in general-purpose, cellular communications, wireless connectivity and digital video applications, covering more than 40 standards or modulation types. Applications are supported on both benchtop and modular, with the only difference being the level of performance achieved by the hardware you select.
Top Features
With the LTE/LTE-Advanced FDD and TDD measurement application, you can perform RF transmitter measurements on eNB and UE devices in time, frequency, and modulation domains. Measurement setups are simplified with automatic detection of downlink channels and signals. For eNB conformance testing, measurement is simplified by recalling E-TM presets according to 3GPP TS 36.141 specifications.
Downlink eNB measurements
LTE downlink modulation analysis
Figure 1 is an LTE downlink modulation analysis measurement showing constellation, detected allocation, frame summary, and error summary information. Measurements are color-coded based on channel type for ease of troubleshooting.
LTE-Advanced downlink analysis
An LTE-Advanced downlink modulation analysis showing constellation of five component carriers side-by-side is displayed in Figure 2.
Downlink transport layer channel decoding
Figure 3 shows a downlink transport layer channel decoding measurement with decoded information for PBCH, PDCCH, PCFICH, and PHICH channels. Similar capability is also available for uplink.
Top Features (continued)
Downlink eNB measurements (continued)
LTE-Advanced cross-carrier summary
LTE-Advanced cross-carrier summary trace showing time alignment error (TAE) and channel power of each CC relative to CC0 is displayed in Figure 4.
LTE-Advanced ACLR measurement
Figure 5 shows an LTE-Advanced ACLR measurement with five contiguous component carriers.
LTE-Advanced cumulative ACLR
LTE-Advanced cumulative ACLR (CACLR) for non-contiguous carrier aggregation is shown in Figure 6.
Top Features (continued)
Downlink eNB measurements (continued)
Transmit ON/OFF power measurement
Figure 7 shows a transmit ON/OFF power measurement of an LTEAdvanced TDD downlink signal with two component carriers.
LTE-Advanced non-contiguous carrier aggregation SEM measurement
An LTE-Advanced non-contiguous carrier aggregation SEM measurement with a special cumulative mask inside the sub-block gap is shown in Figure 9.
Top Features (continued)
Uplink UE measurements
Uplink modulation analysis
Uplink modulation analysis measurement showing constellation, EVM vs. subcarrier, detected allocation, and EVM vs. symbol information for two component carriers. Measurements are color-coded based on channel type and up to 12 markers with marker coupling between measurements are available for easier troubleshooting. (Figure 10)
Conformance EVM measurement
Conformance EVM measurement showing all required modulation quality metrics. This measurement is optimized for manufacturing because of its fast measurement speed. (Figure 11)
Real-time view of LTE-Advanced FDD uplink
Figure 12 shows a real-time view of LTE-Advanced FDD uplink with simultaneous PUCCH and frequency hopped PUSCH signal configuration using the RTSA option on a PXA or MXA signal analyzer.
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