DSOX6JITTER Jitter Analysis Option

Keysight DSOX6JITTER

Jitter Analysis Option For InfiniiVision 6000 X-Series Oscilloscopes

Data Sheet

Introduction

As data rates continue to increase in today’s state-of-the-art high-speed digital designs, timing budgets are decreasing. Ensuring that high-speed clocks and serial data signals are valid and stable when receivers sample data often requires an understanding of the effects of the various components of jitter that may contribute to decreased valid data windows. With the DSOX6JITTER jitter analysis option, the InfiniiVision 6000 X-Series oscilloscope can perform various types of jitter analysis measurements with multiple views and quantization of jitter to provide you with valuable insight into the source of unwanted timing errors. The Keysight Technologies, Inc. InfiniiVision 6000 X-Series oscilloscope with the DSOX6JITTER jitter analysis option is the lowest priced oscilloscope jitter analysis test solution in the market today.

Features

• Serial data TIE jitter measurements
• Clock jitter measurements including: clock TIE, N period, period to period, +width to +width, -width to -width, and duty cycle
• Various clock recovery algorithms including: constant/fixed clock, 1st order phase-locked loop (PLL) with loop bandwidth, and 2nd order PLL with loop bandwidth and damping factor
• Various views/plots of jitter including: jitter histogram, jitter trend, jitter spectrum, and jitter statistics
• Color-graded real-time eye with automatic eye-opening measurements

Types of Jitter Analysis

There are various types of jitter analysis measurements that can be selected and performed using the DSOX6JITTER jitter analysis option. Jitter on clock signals can be measured either relative to a software-based recovered ideal clock or relative to selected cycles of the clock signal itself. Jitter measurements on serial data signals, which are sometimes referred to as Time Interval Error (TIE), can be performed relative to either an explicit reference clock or software-based recovered clock.

Figure 1 shows the InfiniiVision 6000 X-Series oscilloscope jitter analysis selection/setup menu. The following table summarizes the various types of jitter analysis that can be selected and performed using the DSOX6JITTER option licensed on an InfiniiVision 6000 X-Series oscilloscope.

Views/Plots of Jitter Measurements

Various views/plots of jitter, as well as statistical results of jitter measurements, can be selected to help provide insight into the distribution and source of timing errors including the following:

• Jitter histogram
• Jitter trend
• Jitter spectrum
• Jitter statistics
• Real-time eye

Figure 2 shows an example of a serial data TIE measurement with a jitter histogram plot and jitter trend plot. The histogram shows the probability distribution function (PDF) of accumulated timing errors along with numerical statistics of measured jitter. The jitter trend plot shows timing error of each serial data edge time-correlated to the input data signal (yellow trace) that is under test. In other words, the jitter trend waveform plots timing error on the vertical axis (sec/div) versus time on the horizontal axis.

Figure 3 shows an example of a serial data TIE measurement with the jitter spectrum view along with a jitter trend plot. The jitter spectrum is actually a Fast Fourier Transform (FFT) waveform math operation performed on the jitter trend waveform data. This view of jitter can often times help identify periodic components of jitter as illustrated in this jitter measurement example. Also available are frequency-domain search features to automatically identify peak frequencies. Note that although they not shown, all three views of jitter analysis (histogram, trend, and spectrum) and can be selected and viewed simultaneously.