Column Control DTX

Jitter Measurement Analysis using Keysight Oscilloscopes

Application Notes

As data rates continue to increase in today’s state-of-the-art high-speed digital designs, timing budgets are decreasing. Ensuring that serial data signals are valid and stable when receivers sample the data often requires an understanding of the effects of the various components of jitter that may contribute to decreased valid data windows. The primary measurement tool used today by hardware design engineers to capture and view waveform jitter is an oscilloscope. Many of today’s higher performance oscilloscopes also provide optional jitter analysis measurement capabilities that can not only be used to view jitter in different display formats, but they can also quantize the various components of jitter.

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Column Control DTX