Probing Magnetic Properties of Materials Using AFMs

Application Notes

Magnetic force microcopy (MFM) is a mode derived from AFM for probing mechanical properties of materials. The key requirement of this technique is the separation of the response caused by long-range magnetic interactions from the response due to short-range topographic interactions. In order to achieve that, MFM is operated in a two-pass way. A irst scan is taken to obtain the surface morphology, followed by positioning the magnetized tip at a certain distance above the sample. Qualitative mapping of a sample’s magnetic domains is obtained in the second pass (phase image) by guiding the tip along the surface contour acquired in the irst scan. Magnetic media is commonly used to store data. This application brief presents a few examples of examining material’s magnetic properties of data storage devices as well as some other materials using the Keysight Technologies, Inc. 7500 atomic force microscope.

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Probing Magnetic Properties of Materials Using AFMs

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