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Application Notes
One of the key advantages of atomic force microscopy (AFM) over other members within the microscopy family is its capability of being operated under different environments. Particularly, a complete control of the relative humidity (RH) in air surrounding the localized tip/sample region is highly desired for an AFM as it will render users a valuable means to address a lot of humidity-dependent issues. The Keysight Technologies, Inc. 7500 AFM system is comprised of a sealed environmental chamber with eight accessible ports and a build-in humidity senor, thus allowing the in situ monitoring and control of the RH during AFM measurements. In this application brief, investigations of the inluence of humidity on selected surface reactions using Keysight 7500 AFM will be presented.
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